Patents by Inventor Daniel R. Adney

Daniel R. Adney has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for testing integrated circuit devices having contacts on multiple surfaces
    Patent number: 7385408
    Abstract: An apparatus and method which allows for testing a semiconductor device having contacts on multiple surfaces has a contactor assembly for holding a semiconductor device and for sending test signals from the test board to and from a first surface and a second surface of the semiconductor device. A latching device is removably coupled to the contactor assembly. The latching device is used to secure the semiconductor device to the contactor assembly and for sending test signals to and from the second surface of the semiconductor package to the contactor assembly.
    Type: Grant
    Filed: July 12, 2005
    Date of Patent: June 10, 2008
    Assignee: Amkor Technology, Inc.
    Inventors: Daniel R. Adney, Rodger E. Kells
  • Apparatus and method for allowing testing of semiconductor devices at different temperatures
    Patent number: 6608497
    Abstract: An apparatus and method for maintaining a uniform temperature to allow for the environmental testing of an integrated circuit. A contactor assembly is used for connecting the integrated circuit to a piece of testing equipment. The contactor assembly is able to altering a temperature of the integrated circuit. A porting assembly is coupled to the testing equipment and to the contactor assembly. The porting assembly transfers a gas to the contactor assembly in order to allow the contactor assembly to alter the temperature of the integrated circuit.
    Type: Grant
    Filed: October 15, 2001
    Date of Patent: August 19, 2003
    Assignee: Amkor Technology, Inc.
    Inventors: Daniel R. Adney, Ignacio A. Mendiola, Jr.