Patents by Inventor Daniel R. Cline

Daniel R. Cline has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5936900
    Abstract: An integrated circuit memory device (10) is provided that has a self test monitor mode. The memory device (10) includes a memory array (26) having a plurality of memory cells. The memory device (10) further includes a built-in self test circuit (12) connected to receive a self test select signal. The built-in self test circuit (12) is operable, when the memory device (10) is in self test mode, to generate internal self test signals for operating and testing the memory array (26). A data buffer (28) is connected to receive the internal self test signals and a monitor mode signal. The data buffer (28) is operable, when the memory device (10) is in self test monitor mode, to connect the internal self test signals to terminals of the memory device (10) to provide the internal self test signals externally from the memory device (10). The monitored internal self test signals can be used to verify operation of the built-in self test circuit (12).
    Type: Grant
    Filed: November 14, 1997
    Date of Patent: August 10, 1999
    Assignee: Texas Instruments Incorporated
    Inventors: Kuong Hua Hii, Theo J. Powell, Daniel R. Cline