Patents by Inventor Daniel R. Hamrick

Daniel R. Hamrick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160074125
    Abstract: Improved devices, systems, and methods for planning cataract surgery on an eye of a patient incorporate results of prior corrective surgeries into a planned cataract surgery of a particular patient by driving an effective surgery vector function based on data from the prior corrective surgeries. The exemplary effective surgery vector employs an influence matrix which may allow improved refractive corrections to be generated so as to increase the overall efficacy of a cataract surgery by specifying one or more parameters of an intraocular lens (IOL) to be implanted during the cataract surgery.
    Type: Application
    Filed: November 23, 2015
    Publication date: March 17, 2016
    Inventors: Thomas D. Raymond, Daniel R. Neal, Richard J. Copland, Wei Xiong, Paul Pulaski, Stephen W. Farrer, Carmen Canovas, Daniel R. Hamrick
  • Patent number: 6819413
    Abstract: An enhanced dynamic range wavefront sensing system includes a light source disposed on a first side of an optically transmissive device, a wavefront sensor disposed on a second side of an optically transmissive device, a relay imaging system disposed between the optically transmissive device and the wavefront sensor, and means for adjusting a distance between the light source and the optically transmissive device. Beneficially, the relay imaging system includes a range-limiting aperture to insure that the wavefront sensor never goes out of range so that a feedback system can be employed to move the light source one focal length away from the optically transmissive device.
    Type: Grant
    Filed: August 29, 2003
    Date of Patent: November 16, 2004
    Assignee: Wavefront Sciences, Inc.
    Inventors: Daniel R. Neal, Richard J. Copland, Ron R. Rammage, Daniel M. Topa, Daniel R. Hamrick
  • Publication number: 20040041978
    Abstract: An enhanced dynamic range wavefront sensing system includes a light source disposed on a first side of an optically transmissive device, a wavefront sensor disposed on a second side of an optically transmissive device, a relay imaging system disposed between the optically transmissive device and the wavefront sensor, and means for adjusting a distance between the light source and the optically transmissive device. Beneficially, the relay imaging system includes a range-limiting aperture to insure that the wavefront sensor never goes out of range so that a feedback system can be employed to move the light source one focal length away from the optically transmissive device.
    Type: Application
    Filed: August 29, 2003
    Publication date: March 4, 2004
    Inventors: Daniel R. Neal, Richard J. Copland, Ron R. Rammage, Daniel M. Topa, Daniel R. Hamrick
  • Patent number: 6624896
    Abstract: A metrology system and method uses pulsed light to allow continuous movement of a target relative to the sensor. A metrology system and method uses dynamic adjustment of tilt in a system. A metrology system and method calibrates the system to remove inherent optical aberrations in the system. Filtering may also be used in the system to increase accuracy.
    Type: Grant
    Filed: October 18, 2000
    Date of Patent: September 23, 2003
    Assignee: WaveFront Sciences, Inc.
    Inventors: Daniel R. Neal, Daniel R. Hamrick, Thomas D. Raymond
  • Patent number: 6547395
    Abstract: Metrology is performed using short, temporally resolved measurements in order to “freeze” the deformation of the object at a particular instant in time. The pulsed light beams are used to conduct metrology of moving objects and objects which are moved relative to the detector for measurement thereof. The motion may be translational, spiral and/or rotational. The duty cycle of the light source may be varied to in accordance with the control of the operation of the detector to perform metrology using a reduced total exposure of an object, while increasing the amount of light available for the measurement.
    Type: Grant
    Filed: February 22, 2000
    Date of Patent: April 15, 2003
    Assignee: WaveFront Sciences, Inc.
    Inventors: Daniel R. Neal, Christopher Burak, Daniel R. Hamrick