Patents by Inventor Daniel R. Pfunder

Daniel R. Pfunder has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9015542
    Abstract: Apparatus and techniques for performing JTAG testing on production devices and systems through industry standard interfaces. The devices employ processors configured to receive packetized test input data from a tester over a standard communication interface such as a USB or Ethernet port and perform associated testing operations defined by the test input data, such as JTAG-compliant testing. This is facilitated, in part, via use of a bridge and one or more DFx handlers, with the bridge operating as an interface between the DFx handlers and a bus and/or interconnect over which test input and result data is transferred via the standard communication interface. The techniques enable testing such as JTAG testing to be performed on fully-assembled devices and systems without requiring the use of dedicated test or debug ports.
    Type: Grant
    Filed: October 1, 2011
    Date of Patent: April 21, 2015
    Assignee: Intel Corporation
    Inventors: Keith A. Jones, Daniel R. Pfunder, John H. Zurawski
  • Publication number: 20130124934
    Abstract: Apparatus and techniques for performing JTAG testing on production devices and systems through industry standard interfaces. The devices employ processors configured to receive packetized test input data from a tester over a standard communication interface such as a USB or Ethernet port and perform associated testing operations defined by the test input data, such as JTAG-compliant testing. This is facilitated, in part, via use of a bridge and one or more DFx handlers, with the bridge operating as an interface between the DFx handlers and a bus and/or interconnect over which test input and result data is transferred via the standard communication interface. The techniques enable testing such as JTAG testing to be performed on fully-assembled devices and systems without requiring the use of dedicated test or debug ports.
    Type: Application
    Filed: October 1, 2011
    Publication date: May 16, 2013
    Inventors: Keith A. Jones, Daniel R. Pfunder, John H. Zurawski