Patents by Inventor Daniel Richard Bockelman

Daniel Richard Bockelman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated circuit testing with laser stimulation and emission analysis
    Patent number: 7777507
    Abstract: A diagnostic tool for testing an integrated circuit device directs a beam of laser energy to stimulate at least a portion of the device. In one mode, electromagnetic waves from said device may be detected at the same time in response to the stimulation. A processor collects image data and determines as a function of the collected image data whether the device has a defect. Other embodiments are described and claimed.
    Type: Grant
    Filed: March 26, 2007
    Date of Patent: August 17, 2010
    Assignee: Intel Corporation
    Inventors: Daniel Richard Bockelman, Yuan-Chuan Steven Chen, Christopher John Brookreson, Md Asifur Rahman
  • INTEGRATED CIRCUIT TESTING WITH LASER STIMULATION AND EMISSION ANALYSIS
    Publication number: 20080238435
    Abstract: A diagnostic tool for testing an integrated circuit device directs a beam of laser energy to stimulate at least a portion of the device. In one mode, electromagnetic waves from said device may be detected at the same time in response to the stimulation. A processor collects image data and determines as a function of the collected image data whether the device has a defect. Other embodiments are described and claimed.
    Type: Application
    Filed: March 26, 2007
    Publication date: October 2, 2008
    Inventors: Daniel Richard Bockelman, Yuan-Chuan Steven Chen, Christopher John Brookreson, Md Asifur Rahman