Patents by Inventor Daniel Stanley Young Tan

Daniel Stanley Young Tan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11615518
    Abstract: A method for generating reconstruction a reconstructed image is adapted to an input image having a target object. The method comprises converting the input image into a feature map with vectors by an encoder; performing a training procedure according to training images of reference objects to generate feature prototypes associated with the training images and store the feature prototypes to a memory; selecting a part of feature prototypes from the feature prototypes stored in the memory according to similarities between the feature prototypes and the feature vectors; generating a similar feature map according the part of feature prototypes and weights, wherein the weights represents similarities between the part of feature prototypes and the feature vectors; and converting the similar feature map into the reconstructed image by a decoder; wherein the encoder, the decoder and the memory form an auto-encoder.
    Type: Grant
    Filed: February 9, 2021
    Date of Patent: March 28, 2023
    Assignees: INVENTEC (PUDONG) TECHNOLOGY CORPORATION, INVENTEC CORPORATION
    Inventors: Daniel Stanley Young Tan, Yi-Chun Chen, Trista Pei-Chun Chen, Wei-Chao Chen
  • Publication number: 20220156910
    Abstract: A method for generating reconstruction a reconstructed image is adapted to an input image having a target object. The method comprises converting the input image into a feature map with vectors by an encoder; performing a training procedure according to training images of reference objects to generate feature prototypes associated with the training images and store the feature prototypes to a memory; selecting a part of feature prototypes from the feature prototypes stored in the memory according to similarities between the feature prototypes and the feature vectors; generating a similar feature map according the part of feature prototypes and weights, wherein the weights represents similarities between the part of feature prototypes and the feature vectors; and converting the similar feature map into the reconstructed image by a decoder; wherein the encoder, the decoder and the memory form an auto-encoder.
    Type: Application
    Filed: February 9, 2021
    Publication date: May 19, 2022
    Inventors: Daniel Stanley Young Tan, Yi-Chun Chen, Trista Pei-Chun Chen, Wei-Chao Chen
  • Patent number: 11315229
    Abstract: A method for training a defect detector comprises: obtaining a first reference image of a first reference object, wherein the first reference object has a defect and the first reference image has a first label indicating the defect; training a reconstruction model according to a second reference image of a second reference object associated with the first reference object, wherein a defect level of the second reference object is in a tolerable range with an upper limit; obtaining a target image of a target object associated with the first reference object and the second reference object; generating a second label according to the target image, the reconstruction model and an error calculation procedure, wherein the second label comprises a defect of the target object; and training a defect detector by performing a machine learning algorithm according to the first reference image, the target image and the second label.
    Type: Grant
    Filed: June 19, 2020
    Date of Patent: April 26, 2022
    Assignees: INVENTEC (PUDONG) TECHNOLOGY CORPORATION, INVENTEC CORPORATION
    Inventors: Yi-Chun Chen, Trista Pei-Chun Chen, Daniel Stanley Young Tan, Wei-Chao Chen
  • Publication number: 20210383168
    Abstract: A method for labeling image comprises: obtaining a target image of a target object; generating a reconstruction image according to the target image and a reconstruction model, wherein the reconstruction model is trained with a plurality of reference images and a machine learning algorithm, each of the reference images is an image of a reference object whose defect level is in a tolerable range with an upper limit, and each of the reference objects is associated with the target object; generating a first difference image and a second difference image respectively by performing a first difference algorithm and a second difference algorithm respectively according to the target image and the reconstruction image; and generating an output image by performing a pixel-scale operation according to the first difference image and the second difference image, wherein the output image includes a label indicating a defect of the target object.
    Type: Application
    Filed: June 18, 2020
    Publication date: December 9, 2021
    Inventors: YI-CHUN CHEN, Trista Pei-Chun Chen, Daniel Stanley Young Tan, Wei-Chao Chen
  • Publication number: 20210383526
    Abstract: A method for training a defect detector comprises: obtaining a first reference image of a first reference object, wherein the first reference object has a defect and the first reference image has a first label indicating the defect; training a reconstruction model according to a second reference image of a second reference object associated with the first reference object, wherein a defect level of the second reference object is in a tolerable range with an upper limit; obtaining a target image of a target object associated with the first reference object and the second reference object; generating a second label according to the target image, the reconstruction model and an error calculation procedure, wherein the second label comprises a defect of the target object; and training a defect detector by performing a machine learning algorithm according to the first reference image, the target image and the second label.
    Type: Application
    Filed: June 19, 2020
    Publication date: December 9, 2021
    Inventors: YI-CHUN CHEN, Trista Pei-Chun CHEN, Daniel Stanley Young Tan, Wei-Chao CHEN
  • Patent number: 11176419
    Abstract: A method for labeling image comprises: obtaining a target image of a target object; generating a reconstruction image according to the target image and a reconstruction model, wherein the reconstruction model is trained with a plurality of reference images and a machine learning algorithm, each of the reference images is an image of a reference object whose defect level is in a tolerable range with an upper limit, and each of the reference objects is associated with the target object; generating a first difference image and a second difference image respectively by performing a first difference algorithm and a second difference algorithm respectively according to the target image and the reconstruction image; and generating an output image by performing a pixel-scale operation according to the first difference image and the second difference image, wherein the output image includes a label indicating a defect of the target object.
    Type: Grant
    Filed: June 18, 2020
    Date of Patent: November 16, 2021
    Assignees: INVENTEC (PUDONG) TECHNOLOGY CORPORATION, INVENTEC CORPORATION
    Inventors: Yi-Chun Chen, Trista Pei-Chun Chen, Daniel Stanley Young Tan, Wei-Chao Chen