Abstract: An adapter that can connect to an objective has a receiving area for receiving the objective. The adapter has holding structures which extend essentially in a plane directed transversely to the objective axis of the objective and which are designed to engage corresponding structural elements of an adapter receptacle while the adapter is being inserted into the adapter receptacle, thereby preventing the adapter from already moving in the direction of the objective axis while the adapter is being inserted into the adapter receptacle. A device for holding an adapter, can include an adapter receptacle for receiving the adapter and an adapter and also for moving an optical element into the objective axis. An adjusting device can include the adapter and the adapter receptacle.

Abstract: Disclosed is a changing device for optical components in a microscope. The changing device includes an optical component having a flat surface. The changing device further includes a carrier for inserting and/or holding the optical component. The changing device further includes a receptacle for holding the carrier in an optical path of the microscope. The carrier has bearing surfaces for the flat surface of the optical component and positioning surfaces located in the same plane, which are not covered by the optical component, when inserting the latter. The receptacle has bearing surfaces for contact with the positioning surfaces and first attachment means for attaching the carrier positioned on the receptacle in order for the positioning surfaces to act upon the bearing surfaces.

Abstract: The invention relates firstly to a method for determining a mechanical deviation on a displacement path of an optical zoom lens, in particular on a displacement path of an optical zoom lens of a microscope. The optical zoom lens is arranged in a beam path between an object to be recorded and an electronic image sensor. In a first method step, an optical marker is introduced into the beam path at a position of the beam path located between the object to be recorded and the optical zoom lens, such that the optical marker passes the optical zoom lens and then is depicted on an image in which a position of the optical marker is detected and determined. This is compared with a reference position of the optical marker in order to determine the mechanical deviation on the displacement path of the optical zoom lens. The invention further relates to a method for correction of a displacement error of an image recorded by an electronic image sensor and to an electronic image recording device.

Abstract: An adjustable stop includes stop elements, each being movable in a stop plane that extends laterally from a through axis of the stop. Portions of a periphery of each stop element delimit an aperture around the axis based on current set positions of the element. Drives are configured for setting the set positions of the elements. Each element is embodied as a cam disk or a sector of a cam disk, which is rotatable about an axis parallel to the through axis. Each element has a differently shaped peripheral segments so that the current set position of the element configured to set a selected size and/or shape of the aperture, such that a desired peripheral segment of the element forms a portion of the delimitation of the aperture. Radial distances of the peripheral segments of an element increase over an angular range of the element toward the axis of rotation.

Abstract: The invention relates firstly to a method for determining a mechanical deviation on a displacement path of an optical zoom lens, in particular on a displacement path of an optical zoom lens of a microscope. The optical zoom lens is arranged in a beam path between an object to be recorded and an electronic image sensor. In a first method step, an optical marker is introduced into the beam path at a position of the beam path located between the object to be recorded and the optical zoom lens, such that the optical marker passes the optical zoom lens and then is depicted on an image in which a position of the optical marker is detected and determined. This is compared with a reference position of the optical marker in order to determine the mechanical deviation on the displacement path of the optical zoom lens. The invention further relates to a method for correction of a displacement error of an image recorded by an electronic image sensor and to an electronic image recording device.

Abstract: Changing device for optical components in a microscope, comprising an optical component (12) having a flat surface (13), a carrier (1) for inserting and/or holding the optical component (12), and a receptacle (26) for holding the carrier (1) in an optical path of the microscope, characterized in that the carrier (1) has bearing surfaces (8) for the flat surface (13) of the optical component (1) and positioning surfaces (10) located in the same plane, which are not covered by the optical component (12), when inserting the latter, and the receptacle (26) has bearing surfaces (28) for contact with the positioning surfaces (10), and first attachment means (11) for attaching the carrier (1) positioned on the receptacle (26) in order for the positioning surfaces (10) to act upon the bearing surfaces (28).

Abstract: The invention relates firstly to a method for determining a mechanical deviation on a displacement path of an optical zoom lens (03), in particular on a displacement path of an optical zoom lens (03) of a microscope. The optical zoom lens (03) is arranged in a beam path (01) between an object (19) to be recorded and an electronic image sensor (04). In a first method step, an optical marker is introduced into the beam path (01) at a position of the beam path (01) located between the object (19) to be recorded and the optical zoom lens (03), such that the optical marker passes the optical zoom lens (03) and then is depicted on an image in which a position of the optical marker is detected and determined. This is compared with a reference position of the optical marker in order to determine the mechanical deviation on the displacement path of the optical zoom lens (03).

Abstract: Changing device for optical components in a microscope, comprising an optical component (12) having a flat surface (13), a carrier (1) for inserting and/or holding the optical component (12), and a receptacle (26) for holding the carrier (1) in an optical path of the microscope, characterized in that the carrier (1) has bearing surfaces (8) for the flat surface (13) of the optical component (1) and positioning surfaces (10) located in the same plane, which are not covered by the optical component (12), when inserting the latter, and the receptacle (26) has bearing surfaces (28) for contact with the positioning surfaces (10), and first attachment means (11) for attaching the carrier (1) positioned on the receptacle (26) in order for the positioning surfaces (10) to act upon the bearing surfaces (28).

Abstract: An objective-changer apparatus for a microscope system comprising an objective-transfer element with at least one objective holder for holding an objective that has been provided with an adapter, wherein the objective-transfer element moves a selected active objective into position in a transfer position in controlled fashion and an objective axis of the active objective does not coincide with the optical axis of the microscope system in the transfer position. A receiving apparatus is adjustable in the direction of the optical axis of the microscope system and can be brought into contact with the adapter. The receiving apparatus transports the active objective along a transport path in a transport direction orthogonal to the microscope system's optical axis between the transfer position and a work position in line with the microscope system's optical axis. The transport path is shorter than the extent of the objective holder in the transport direction.

Abstract: An adapter that can connect to an objective has a receiving area for receiving the objective. The adapter has holding structures which extend essentially in a plane directed transversely to the objective axis of the objective and which are designed to engage corresponding structural elements of an adapter receptacle while the adapter is being inserted into the adapter receptacle, thereby preventing the adapter from already moving in the direction of the objective axis while the adapter is being inserted into the adapter receptacle. A device for holding an adapter, can include an adapter receptacle for receiving the adapter and an adapter and also for moving an optical element into the objective axis. An adjusting device can include the adapter and the adapter receptacle.

Abstract: The invention relates firstly to a method for determining a mechanical deviation on a displacement path of an optical zoom lens (03), in particular on a displacement path of an optical zoom lens (03) of a microscope. The optical zoom lens (03) is arranged in a beam path (01) between an object (19) to be recorded and an electronic image sensor (04). In a first method step, an optical marker is introduced into the beam path (01) at a position of the beam path (01) located between the object (19) to be recorded and the optical zoom lens (03), such that the optical marker passes the optical zoom lens (03) and then is depicted on an image in which a position of the optical marker is detected and determined. This is compared with a reference position of the optical marker in order to determine the mechanical deviation on the displacement path of the optical zoom lens (03).

Abstract: An objective-changer apparatus for a microscope system comprising an objective-transfer element with at least one objective holder for holding an objective that has been provided with an adapter, wherein the objective-transfer element moves a selected active objective into position in a transfer position in controlled fashion and an objective axis of the active objective does not coincide with the optical axis of the microscope system in the transfer position. A receiving apparatus is adjustable in the direction of the optical axis of the microscope system and can be brought into contact with the adapter. The receiving apparatus transports the active objective along a transport path in a transport direction orthogonal to the microscope system's optical axis between the transfer position and a work position in line with the microscope system's optical axis . The transport path is shorter than the extent of the objective holder in the transport direction.