Abstract: In one form, a flip-flop comprises a master latch, a slave latch, and a multiplexer. The master latch has an input for receiving a data input signal, and an output, and operates in transparent and latching modes during respective first and second phases of a clock signal. The slave latch has an input coupled to the output of the master latch, and an output, and operates in the transparent and latching modes during the second and first phases of the clock signal, respectively. The multiplexer has a first input coupled to the output of the slave latch, a second input coupled to the output of the master latch, and an output for providing a data output signal, and provides the first input to the output during the first phase of the clock signal, and the second input to the output during the second phase of the clock signal.

Abstract: In one form, a scan flip-flop includes a clock gating cell and a dedicated clock flip-flop. The clock gating cell provides an input clock input signal as a scan clock signal when a scan shift enable signal is active, and provides the input clock signal as a data clock signal when the scan shift enable signal is inactive. The dedicated clock flip-flop stores a data input signal and provides the data input signal, so stored, as a data output signal in response to transitions of the data clock signal, and stores a scan data input signal and provides the scan data input signal, so stored, as the data output signal in response to transitions of the scan clock signal. The clock gating cell may further provide the input clock signal as the data clock signal when both a scan shift enable signal is inactive and a data enable signal is active.

Abstract: In one form, a scan flip-flop includes a clock gating cell and a dedicated clock flip-flop. The clock gating cell provides an input clock input signal as a scan clock signal when a scan shift enable signal is active, and provides the input clock signal as a data clock signal when the scan shift enable signal is inactive. The dedicated clock flip-flop stores a data input signal and provides the data input signal, so stored, as a data output signal in response to transitions of the data clock signal, and stores a scan data input signal and provides the scan data input signal, so stored, as the data output signal in response to transitions of the scan clock signal. The clock gating cell may further provide the input clock signal as the data clock signal when both a scan shift enable signal is inactive and a data enable signal is active.

Abstract: In one form, a flip-flop comprises a master latch, a slave latch, and a multiplexer. The master latch has an input for receiving a data input signal, and an output, and operates in transparent and latching modes during respective first and second phases of a clock signal. The slave latch has an input coupled to the output of the master latch, and an output, and operates in the transparent and latching modes during the second and first phases of the clock signal, respectively. The multiplexer has a first input coupled to the output of the slave latch, a second input coupled to the output of the master latch, and an output for providing a data output signal, and provides the first input to the output during the first phase of the clock signal, and the second input to the output during the second phase of the clock signal.

Abstract: Leakage current is reduced in a plurality of gates coupled between source storage elements and destination storage elements by waking the plurality of gates to allow current flow in response to assertion of any source clock enable signals that enable clocking of the source storage elements. The gates are slept to reduce leakage current in the plurality of gates, in response to assertion of a destination clock enable signal and all of the one or more source clock enable signals being deasserted, the destination clock enable signal enabling clocking of the destination storage elements.

Abstract: A first and second plurality of gates are coupled respectively between first and second source storage elements and first and second destination storage elements. The first and second plurality of gates are slept to reduce leakage current in the plurality of gates under certain conditions by turning off respective one or more transistors between the first and second plurality of gates and power supplies. A third plurality of gates are maintained in a reduced leakage current state (sleep state) or regular state (wake state) based on conditions associated with the source and destination elements for the first and second plurality of gates.

Abstract: A semiconductor device includes a primary voltage rail, a secondary voltage rail, a plurality of transistors coupled between the primary and secondary voltage rails, and control logic operable to enable a first subset of the plurality of transistors to couple the primary voltage rail to the secondary voltage rail. During a steady state condition, the first subset comprises less than all of the plurality of transistors.

Abstract: A method, electronic device, and system are provided in which data is stored in a gateable retention storage element. Also provided is a computer readable storage device encoded with data for adapting a manufacturing facility to create an apparatus which includes a silicon chip. The method includes storing a data value in a storage element, wherein the storage element is at least one of a flip-flop, a latch or a register. The method also includes placing the storage element in a low power state comprising removing one or more existing connections between the actual ground node and at least one other component in the storage element. The method also includes maintaining the data value in the storage element subsequent to placing the storage element into the low power state. The electronic device includes a storage component for storing a data value.

Abstract: Leakage current is reduced in a plurality of gates coupled between source storage elements and destination storage elements by waking the plurality of gates to allow current flow in response to assertion of any source clock enable signals that enable clocking of the source storage elements. The gates are slept to reduce leakage current in the plurality of gates, in response to assertion of a destination clock enable signal and all of the one or more source clock enable signals being deasserted, the destination clock enable signal enabling clocking of the destination storage elements.

Abstract: A first and second plurality of gates are coupled respectively between first and second source storage elements and first and second destination storage elements. The first and second plurality of gates are slept to reduce leakage current in the plurality of gates under certain conditions by turning off respective one or more transistors between the first and second plurality of gates and power supplies. A third plurality of gates are maintained in a reduced leakage current state (sleep state) or regular state (wake state) based on conditions associated with the source and destination elements for the first and second plurality of gates.

Abstract: A semiconductor device includes a primary voltage rail, a secondary voltage rail, a plurality of transistors coupled between the primary and secondary voltage rails, and control logic operable to enable a first subset of the plurality of transistors to couple the primary voltage rail to the secondary voltage rail. During a steady state condition, the first subset comprises less than all of the plurality of transistors.

Abstract: A method, electronic device, and system are provided in which data is stored in a gateable retention storage element. Also provided is a computer readable storage device encoded with data for adapting a manufacturing facility to create an apparatus which includes a silicon chip. The method includes storing a data value in a storage element, wherein the storage element is at least one of a flip-flop, a latch or a register. The method also includes placing the storage element in a low power state comprising removing one or more existing connections between the actual ground node and at least one other component in the storage element. The method also includes maintaining the data value in the storage element subsequent to placing the storage element into the low power state. The electronic device includes a storage component for storing a data value.

Abstract: A compound logic flip-flop. The flip-flop includes a plurality of input stages, wherein each of the input stages is coupled to receive at least one input signal and a clock signal. Each of the plurality of input (i.e. ‘master’) stages is configured to perform a corresponding input logic function during a first phase of a clock cycle and to store a result of the corresponding input logic function. The flip-flop further includes an output (i.e. ‘slave’) stage coupled to receive the clock signal and the results of the input logic functions from each of the plurality of input stages. The output stage is configured, during a second phase of the clock cycle, to logically combine the results of the input logic functions by performing an output logic function and provide an output signal based on a result of the output logic function.

Abstract: A clock generator system (400) includes a phase locked loop (PLL) (402), a first clock generator (404), and a second clock generator (406). The PLL (402) includes a first output configured to provide a first clock signal at a first frequency and a second output configured to provide a second clock signal at the first frequency. The second clock signal is out-of-phase with the first clock signal. An output of the first clock generator (404) is configured to provide a first generated clock signal whose effective frequency is based on both the first and second clock signals and a first mode signal. An output of the second clock generator (406) is configured to provide a second generated clock signal whose effective frequency is based on both the first and second clock signals and a second mode signal.

Abstract: A processor (400) includes a clock source (402), a central processing unit (CPU) (408), and a clock generator (404). The clock source (402) includes an output for providing a periodic clock signal. The CPU (408) includes an input for receiving a CPU clock signal. The clock generator (404) includes a first input coupled to the output of the clock source (402), a second input for receiving a mode signal that indicates an output frequency, and an output coupled to the input of the CPU (408). The clock generator (404) provides the CPU clock signal using periodic pulse skipping such that the CPU clock signal has a number of transitions over a unit of time corresponding to the output frequency.

Abstract: A system, apparatus, and method for a core rationing logic to enable cores of a multi-core processor to adhere to various power and thermal constraints.

Abstract: A clock generator (622) includes a first circuit (812) and a second circuit (814). The first circuit (812) includes a first clock input configured to receive a first clock signal at a first frequency, a second clock input configured to receive a second clock signal at the first frequency, and an output. The second clock signal is out-of-phase with the first clock signal. The second circuit (814) is coupled to the first circuit (812) and includes a mode signal input configured to receive a mode signal. The output of the first circuit (812) is configured to provide a generated clock signal whose effective frequency is based on the first and second clock signals and the mode signal.

Abstract: A first transistor of a level shifter provides conductivity between a reference voltage and a node of the level shifter to hold a state of the level shifter output. When an input signal of the level shifter switches, additional transistors assist in reducing the conductivity of the first transistor. This enhances the ability of the level shifter to change the state of the output in response to the change in the input signal, thereby improving the writeability of the level shifter.

Abstract: An integrated circuit (1600) includes a debug module (1602) and a clock generator (1610). The debug module (1602) is configured to receive a test pattern and provide a mode signal based on the test pattern. The clock generator (1610) includes a first clock input configured to receive a first clock signal, a second clock input configured to receive a second clock signal, and a mode input configured to receive the mode signal. The first and second clock signals are out of phase and have the same clock frequency. The clock generator (1610) is configured to provide a generated clock signal whose effective frequency is based on the first and second clock signals and the mode signal.