Patents by Inventor Daniel W. Snider

Daniel W. Snider has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7523368
    Abstract: A test system including a diagnostics unit comprising a plurality of diagnostics-unit interfaces to communicatively couple the diagnostic unit to a plurality of units under test and a unit diagnostic communication port via which a unit diagnostic control device is communicatively coupled to the diagnostics unit. Each unit under test includes a module bridge interface and boundary-scan test functionality. When the module bridge interface of each of the units under test is communicatively coupled to a respective one of the plurality of the diagnostics unit interfaces, the boundary-scan test functionality of the respective unit under test is communicatively coupled to the unit diagnostic communication port in order to communicate with the unit diagnostic control device when the unit diagnostic control device is communicatively coupled to the diagnostics unit.
    Type: Grant
    Filed: January 26, 2006
    Date of Patent: April 21, 2009
    Assignee: Honeywell International Inc.
    Inventors: Douglas S. Jaworski, Daniel W. Snider
  • Patent number: 7511525
    Abstract: A system including a chassis operable to receive a plurality of physical application modules and a test port via which an external test device is communicatively coupled to the system. Each physical application module includes a module bridge interface and boundary-scan test functionality. The test port is communicatively coupled to each of a chassis bridge interface in the chassis. When the module bridge interface of each of the physical application modules is communicatively coupled to a respective one of the plurality of chassis bridge interfaces, the boundary-scan test functionality of the respective physical application module is communicatively coupled to the test port.
    Type: Grant
    Filed: January 26, 2006
    Date of Patent: March 31, 2009
    Assignee: Honeywell International Inc.
    Inventors: Douglas S. Jaworski, Daniel W. Snider
  • Patent number: 7478298
    Abstract: A test system for testing a backplane comprising an adapter assembly and a generic boundary-scan test unit. The adapter assembly includes an application-specific mating connector to communicatively couple the adapter assembly to an application-specific port of a backplane and an adapter generic connector. The generic boundary-scan test unit includes a test card generic connector to communicatively couple the generic boundary-scan test unit to the adapter generic connector of the adapter assembly and boundary-scan functionality to transmit at least one output test signal. The backplane is tested by communicating the output test signal from the generic boundary-scan test unit to the application-specific mating connector for testing the backplane and communicating at least one input test signal received from the backplane via the application-specific mating connector to the boundary-scan functionality of the generic boundary-scan test unit.
    Type: Grant
    Filed: January 26, 2006
    Date of Patent: January 13, 2009
    Assignee: Honeywell International Inc.
    Inventors: Douglas S. Jaworski, Daniel W. Snider