Abstract: A CMOS-based sensor apparatus comprises an array of sensor cells that are interconnected by a first set of vertical driver lines to a selective driver facility and by a second set of horizontal sensing lines to a sensing facility for sensing respectively sensed amounts of radiation. In particular, the sensor cells through being appropriately spaced in at least either row or column direction, comprise a redundancy facility that is selectively activatable for isolating an interconnect short on the basis of externally applied control actuation.

Abstract: An image sensor (1) having a semiconductor body (2) with a first conductivity type and having a surface (3), the surface being provided with a number of cells (4), a cell comprising a photosensitive element (5) and a reset transistor (6), the reset transistor comprising a source region (7), a drain region (8) and a gate region (9), the source region (7) and the drain region (8) having a second conductivity type opposite to the first conductivity type, the source region (7) of the reset transistor (6) being electrically connected to the photosensitive element (5). There is a well region (10) present which well region extends from the surface (3) into the semiconductor body (2) and extends at least partly below the gate region (9) and the well region has a first conductivity type. The source region (7) extends at least substantially in a doped region (11) of the photosensitive element (5), the doped region (11) having a second conductivity type.