Patents by Inventor Daniel Yocz

Daniel Yocz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Screening method for electrolytic capacitors that maintains individual capacitor unit identity
    Patent number: 11448680
    Abstract: A method of screening a lot of capacitors is provided. The method includes measuring a first leakage current of each individual capacitor in a first set of capacitors and calculating a first mean leakage current; removing each of the individual capacitors having a measured first leakage current equal to or above a first predetermined value, forming a second set of capacitors; subjecting the second set of capacitors to a burn in treatment; measuring a second leakage current for each of the individual capacitors in the second set and calculating a second mean leakage current; comparing the second leakage current for each of the individual capacitors to the first leakage current for each of the individual capacitors; and removing each of the individual capacitors having a second leakage current equal to or above a second predetermined value and/or having a second leakage current that does not change by a specified amount compared to the first leakage current for each of the individual capacitors.
    Type: Grant
    Filed: March 31, 2021
    Date of Patent: September 20, 2022
    Assignee: KYOCERA AVX Components Corporation
    Inventors: Howard Bernier, Daniel Yocz, Glenn Vaillancourt, Jason Laforge
  • Screening Method for Electrolytic Capacitors that Maintains Individual Capacitor Unit Identity
    Publication number: 20210302486
    Abstract: A method of screening a lot of capacitors is provided. The method includes measuring a first leakage current of each individual capacitor in a first set of capacitors and calculating a first mean leakage current; removing each of the individual capacitors having a measured first leakage current equal to or above a first predetermined value, forming a second set of capacitors; subjecting the second set of capacitors to a burn in treatment; measuring a second leakage current for each of the individual capacitors in the second set and calculating a second mean leakage current; comparing the second leakage current for each of the individual capacitors to the first leakage current for each of the individual capacitors; and removing each of the individual capacitors having a second leakage current equal to or above a second predetermined value and/or having a second leakage current that does not change by a specified amount compared to the first leakage current for each of the individual capacitors.
    Type: Application
    Filed: March 31, 2021
    Publication date: September 30, 2021
    Inventors: Howard Bernier, Daniel Yocz, Glenn Vaillancourt, Jason Laforge