Abstract: A polymer electrolyte for a battery cell. The polymer electrolyte includes or substantially consists of a polymaleimide copolymer. The polymaleimide copolymer includes or substantially consists of first polymaleimide repeat units and second polymaleimide repeat units, wherein the first polymaleimide repeat units and the second polymaleimide repeat units are covalently bonded to one another.

Abstract: A polymer electrolyte for a battery cell comprising i) a first polymaleimide polymer comprising first polymaleimide repeat units, wherein the first polymaleimide repeat units are according to R3(Q)?, wherein R3, individually, is a polyether or C(H)h(CxH2x+1)i((CH2)?)j(CH2OC(O)(CH2)?)k, wherein i is between 0 and 2; j and k, individually, are between 0 and 4; h is 4-i-j-k; h+i is between 0 and 2; x is between 1 and 6; L) is between 1 and 10; ? is between 1 and 20; ?, individually, is at least 2; and Q, individually, is according to a particular formula.

Abstract: The present invention discloses a method for producing a particulate material for a composite electrode comprising ball milling of: an electrode active component comprising a transition metal M having a pristine oxidation state of 5+ and optionally 4+ and/or 3+; at least one second additional oxide selected from the group consisting of Li, Al, Cu, Fe, Cr, Mn, Sn, Mo, Ni, Sn, Ag, Ru or Ti and; a first lithium-comprising sulphide compound comprising an element X, X being P, Ge, Si or Sn, wherein an electronically conductive component is added to the electrode active component and the first lithium-comprising sulphide compound, thereby obtaining the particulate material. The present invention further discloses a particulate material obtained by the method, a composite cathode comprising the particulate material and a battery cell comprising the composite cathode.

Abstract: It is herein described a contact probe of a testing head of an apparatus for testing electronic devices comprising a probe body being essentially extended in a longitudinal direction between respective end portions adapted to realize a contact with respective contact pads, at least one end portion having transverse dimensions greater than the probe body and comprising an enlarged portion, projecting only in correspondence of a first side wall of the contact probe. Suitably, the at least one end portion further comprises at least one protrusion projecting from a second side wall, opposite to the first side wall and substantially extending toward the second and opposite wall along a longitudinal axis of the contact probe starting from the enlarged portion.

Abstract: A Li-ion thin film microbattery, a microbattery array, a method of fabricating a Li-ion thin film microbattery and a method of fabricating a microbattery array. The Li-ion thin film microbattery comprises a Li-free cathode comprising a transition metal oxide thin film; an anode comprising a lithiated Ge or Si thin film; and an electrolyte film disposed between the cathode and the anode; wherein a Li-source of the Li-ion thin film microbattery is provided by means of the lithiated Ge or Si thin film.

Abstract: A Li-ion thin film microbattery, a microbattery array, a method of fabricating a Li-ion thin film microbattery and a method of fabricating a microbattery array. The Li-ion thin film microbattery comprises a Li-free cathode comprising a transition metal oxide thin film; an anode comprising a lithiated Ge or Si thin film; and an electrolyte film disposed between the cathode and the anode; wherein a Li-source of the Li-ion thin film microbattery is provided by means of the lithiated Ge or Si thin film.

Abstract: A testing head for testing the working of a device under test comprises a plurality of contact probes, each contact probe having a rod-like body of a predetermined length that extends between a first end and a second end and being housed in respective guide holes made in at least one plate-like lower guide and one plate-like upper guide that are parallel to each other and spaced apart by a bending zone. Suitably, at least one of the lower guide and upper guide is equipped with at least one recessed portion formed at a plurality of those guide holes and realizing lowered portions thereof adapted to reduce a thickness of the plurality of those guide holes.

Abstract: A testing head for testing a device includes a couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes to slidably house a plurality of contact probes, each including a rod-like body extending along a preset longitudinal axis between a first and second ends, the first end being a contact tip that abuts a contact pad of the device and the second end being a contact head that abuts a contact pad of a space transformer. At least one of the supports comprises a couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes. Each contact probe comprises a protruding element or stopper originating from a lateral wall and realized in correspondence of one wall of a guide hole of the guides contacting the lateral wall of the contact probe.

Abstract: A testing head for testing the working of a device under test comprises a plurality of contact probes, each contact probe having a rod-like body of a predetermined length that extends between a first end and a second end and being housed in respective guide holes made in at least one plate-like lower guide and one plate-like upper guide that are parallel to each other and spaced apart by a bending zone. Suitably, at least one of the lower guide and upper guide is equipped with at least one recessed portion formed at a plurality of those guide holes and realizing lowered portions thereof adapted to reduce a thickness of the plurality of those guide holes.

Abstract: A testing head for testing a device includes a couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes to slidably house a plurality of contact probes, each including a rod-like body extending along a preset longitudinal axis between a first and second ends, the first end being a contact tip that abuts a contact pad of the device and the second end being a contact head that abuts a contact pad of a space transformer. At least one of the supports comprises a couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes. Each contact probe comprises a protruding element or stopper originating from a lateral wall and realized in correspondence of one wall of a guide hole of the guides contacting the lateral wall of the contact probe.