Patents by Inventor Danny Grossman
Danny Grossman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20230406047Abstract: There is provided a computerized system comprising a processing unit and associated memory configured to obtain a three-dimensional dataset informative of at least part of a tread of a tire, and determine, using the three-dimensional dataset, data informative of tread depth of the tire.Type: ApplicationFiled: June 12, 2023Publication date: December 21, 2023Inventors: Roman SHKLYAR, Ilya GRINSHPOUN, Danny GROSSMAN, Ilia SHAPIRO
-
Patent number: 11707948Abstract: There is provided a computerized system comprising a processing unit and associated memory configured to obtain a three-dimensional dataset informative of at least part of a tread of a tire, and determine, using the three-dimensional dataset, data informative of tread depth of the tire.Type: GrantFiled: September 30, 2020Date of Patent: July 25, 2023Assignee: UVEYE LTD.Inventors: Roman Shklyar, Ilya Grinshpoun, Danny Grossman, Ilia Shapiro
-
Patent number: 11562472Abstract: A method and system are provided for estimating tire tread depth, the method comprising: obtaining an image of the tire informative of tread and grooves embedded therein, wherein the image is acquired by an imaging device from a first angle relative to a horizontal direction perpendicular to tread surface, and the tire is illuminated by an illumination device from a second angle relative to the horizontal direction, causing a shadow section and an illuminated section at the bottom and/or sidewall of a groove, the first angle being smaller than the second angle, such that the image captures the illuminated section and at least part of the shadow section; performing segmentation on the image to obtain image segments corresponding to the illuminated section and the at least part of the shadow section; and estimating the tread depth based on the image segments, the groove width, and the second angle.Type: GrantFiled: September 30, 2020Date of Patent: January 24, 2023Assignee: UVEYE LTD.Inventors: Danny Grossman, Roman Shklyar, Ilya Grinshpoun
-
Patent number: 11512943Abstract: An optical system and method are presented for use in measurements on an upper surface of a layered sample when located in a measurement plane. The optical system is configured as a normal-incidence system having an illumination channel and a collection channel, and comprises an objective lens unit and a light propagation affecting device. The objective lens unit is accommodated in the illumination and collection channels, thereby defining a common optical path for propagation of illuminating light from the illumination channel toward an illuminating region in the measurement plane and for propagation of light returned from measurement plane to the collection channel. The light propagation affecting device comprises an apertured structure located in at least one of the illumination and collection channels, and configured to provide angular obscuration of light propagation path for blocking angular segments associated with light propagation from regions outside the illuminated region.Type: GrantFiled: November 23, 2016Date of Patent: November 29, 2022Assignee: NOVA LTDInventors: Danny Grossman, Shahar Gov, Moshe Vanhotsker, Guy Engel, Elad Dotan
-
Publication number: 20220101512Abstract: A method and system are provided for estimating tire tread depth, the method comprising: obtaining an image of the tire informative of tread and grooves embedded therein, wherein the image is acquired by an imaging device from a first angle relative to a horizontal direction perpendicular to tread surface, and the tire is illuminated by an illumination device from a second angle relative to the horizontal direction, causing a shadow section and an illuminated section at the bottom and/or sidewall of a groove, the first angle being smaller than the second angle, such that the image captures the illuminated section and at least part of the shadow section; performing segmentation on the image to obtain image segments corresponding to the illuminated section and the at least part of the shadow section; and estimating the tread depth based on the image segments, the groove width, and the second angle.Type: ApplicationFiled: September 30, 2020Publication date: March 31, 2022Inventors: Danny GROSSMAN, Roman SHKLYAR, Ilya GRINSHPOUN
-
Publication number: 20220097463Abstract: There is provided a computerized system comprising a processing unit and associated memory configured to obtain a three-dimensional dataset informative of at least part of a tread of a tire, and determine, using the three-dimensional dataset, data informative of tread depth of the tire.Type: ApplicationFiled: September 30, 2020Publication date: March 31, 2022Inventors: Roman SHKLYAR, Ilya GRINSHPOUN, Danny GROSSMAN, Ilia SHAPIRO
-
Publication number: 20210364451Abstract: A measurement system for use in measuring parameters of a patterned sample, the system including a broadband light source, an optical system configured as an interferometric system, a detection unit, and a control unit, where the interferometric system defines illumination and detection channels having a sample arm and a reference arm having a reference reflector, and is configured for inducing an optical path difference between the sample and reference arms, the detection unit for detecting a combined light beam formed by a light beam reflected from the reflector and a light beam propagating from a sample's support, and generating measured data indicative of spectral interference pattern formed by spectral interference signatures, and the control unit for receiving the measured data and applying a model-based processing to the spectral interference pattern for determining one or more parameters of the pattern in the sample.Type: ApplicationFiled: June 6, 2021Publication date: November 25, 2021Applicant: NOVA MEASURING INSTRUMENTS LTD.Inventors: Gilad BARAK, Danny GROSSMAN, Dror SHAFIR, Yoav BERLATZKY, Yanir HAINICK
-
Patent number: 11029258Abstract: A measurement system for use in measuring parameters of a patterned sample, the system including a broadband light source, an optical system configured as an interferometric system, a detection unit, and a control unit, where the interferometric system defines illumination and detection channels having a sample arm and a reference arm having a reference reflector, and is configured for inducing an optical path difference between the sample and reference arms, the detection unit for detecting a combined light beam formed by a light beam reflected from the reflector and a light beam propagating from a sample's support, and generating measured data indicative of spectral interference pattern formed by spectral interference signatures, and the control unit for receiving the measured data and applying a model-based processing to the spectral interference pattern for determining one or more parameters of the pattern in the sample.Type: GrantFiled: December 24, 2018Date of Patent: June 8, 2021Assignee: NOVA MEASURING INSTRUMENTS LTD.Inventors: Gilad Barak, Danny Grossman, Dror Shafir, Yoav Berlatzky, Yanir Hainick
-
Patent number: 10739277Abstract: A measurement system is presented for use in metrology measurements on patterned samples. The system comprises: at least one light source device configured to generate broadband light, at least one detection device configured to provide spectral information of detected light, and an optical system. The optical system comprises at least an oblique channel system for directing incident light generated by the light source(s) along an oblique illumination channel onto a measurement plane, on which a sample is to be located, and directing broadband light specularly reflected from the sample along a collection channel to the detection device(s). The optical system further comprises an interferometric unit comprising a beam splitting/combining device and a reference reflector device.Type: GrantFiled: April 21, 2016Date of Patent: August 11, 2020Assignee: NOVA MEASURING INSTRUMENTS LTD.Inventors: Yoav Berlatzky, Valery Deich, Dror Shafir, Danny Grossman
-
Publication number: 20190339068Abstract: An optical system and method are presented for use in measurements on an upper surface of a layered sample when located in a measurement plane. The optical system is configured as a normal-incidence system having an illumination channel and a collection channel, and comprises an objective lens unit and a light propagation affecting device. The objective lens unit is accommodated in the illumination and collection channels, thereby defining a common optical path for propagation of illuminating light from the illumination channel toward an illuminating region in the measurement plane and for propagation of light returned from measurement plane to the collection channel. The light propagation affecting device comprises an apertured structure located in at least one of the illumination and collection channels, and configured to provide angular obscuration of light propagation path for blocking angular segments associated with light propagation from regions outside the illuminated region.Type: ApplicationFiled: November 23, 2016Publication date: November 7, 2019Inventors: DANNY GROSSMAN, SHAHAR GOV, MOSHE VANHOTSKER, GUY ENGEL, ELAD DOTAN
-
Patent number: 10365163Abstract: A metrology system is presented for measuring parameters of a structure. The system comprises: an optical system and a control unit. The optical system is configured for detecting light reflection of incident radiation from the structure and generating measured data indicative of angular phase of the detected light components corresponding to reflections of illuminating light components having different angles of incidence. The control unit is configured for receiving and processing the measured data and generating a corresponding phase map indicative of the phase variation along at least two dimensions, and analyzing the phase map using modeled data for determining one or more parameters of the structure.Type: GrantFiled: August 2, 2018Date of Patent: July 30, 2019Assignee: NOVA MEASURING INSTRUMENTS LTD.Inventors: Gilad Barak, Dror Shafir, Danny Grossman
-
Publication number: 20190154594Abstract: A measurement system for use in measuring parameters of a patterned sample, the system including a broadband light source, an optical system configured as an interferometric system, a detection unit, and a control unit, where the interferometric system defines illumination and detection channels having a sample arm and a reference arm having a reference reflector, and is configured for inducing an optical path difference between the sample and reference arms, the detection unit for detecting a combined light beam formed by a light beam reflected from the reflector and a light beam propagating from a sample's support, and generating measured data indicative of spectral interference pattern formed by spectral interference signatures, and the control unit for receiving the measured data and applying a model-based processing to the spectral interference pattern for determining one or more parameters of the pattern in the sample.Type: ApplicationFiled: December 24, 2018Publication date: May 23, 2019Inventors: GILAD BARAK, DANNY GROSSMAN, DROR SHAFIR, YOAV BERLATZKY, YANIR HAINICK
-
Publication number: 20190128823Abstract: A measurement system is presented for use in metrology measurements on patterned samples. The system comprises: at least one light source device configured to generate broadband light, at least one detection device configured to provide spectral information of detected light, and an optical system. The optical system comprises at least an oblique channel system for directing incident light generated by the light source(s) along an oblique illumination channel onto a measurement plane, on which a sample is to be located, and directing broadband light specularly reflected from the sample along a collection channel to the detection device(s). The optical system further comprises an interferometric unit comprising a beam splitting/combining device and a reference reflector device.Type: ApplicationFiled: April 21, 2016Publication date: May 2, 2019Inventors: Yoav BERLATZKY, Valery DEICH, Dror SHAFIR, Danny GROSSMAN
-
Publication number: 20190063999Abstract: A metrology system is presented for measuring parameters of a structure. The system comprises: an optical system and a control unit. The optical system is configured for detecting light reflection of incident radiation from the structure and generating measured data indicative of angular phase of the detected light components corresponding to reflections of illuminating light components having different angles of incidence. The control unit is configured for receiving and processing the measured data and generating a corresponding phase map indicative of the phase variation along at least two dimensions, and analyzing the phase map using modeled data for determining one or more parameters of the structure.Type: ApplicationFiled: August 2, 2018Publication date: February 28, 2019Inventors: Gilad BARAK, Dror SHAFIR, Danny GROSSMAN
-
Patent number: 10161885Abstract: A measurement system for use in measuring parameters of a patterned sample is presented. The system comprises: a broadband light source; an optical system configured as an interferometric system; a detection unit; and a control unit. The interferometric system defines illumination and detection channels having a sample arm and a reference arm comprising a reference reflector, and is configured for inducing an optical path difference between the sample and reference arms; the detection unit comprises a configured and operable for detecting a combined light beam formed by a light beam reflected from said reflector and a light beam propagating from a sample's support, and generating measured data indicative of spectral interference pattern formed by at least two spectral interference signatures. The control unit is configured and operable for receiving the measured data and applying a model-based processing to the spectral interference pattern for determining one or more parameters of the pattern in the sample.Type: GrantFiled: April 12, 2015Date of Patent: December 25, 2018Assignee: NOVA MEASURING INSTRUMENTS LTD.Inventors: Gilad Barak, Danny Grossman, Dror Shafir, Yoav Berlatzky, Yanir Hainick
-
Patent number: 10041838Abstract: A metrology system is presented for measuring parameters of a structure. The system comprises: an optical system and a control unit. The optical system is configured for detecting light reflection of incident radiation from the structure and generating measured data indicative of angular phase of the detected light components corresponding to reflections of illuminating light components having different angles of incidence. The control unit is configured for receiving and processing the measured data and generating a corresponding phase map indicative of the phase variation along at least two dimensions, and analyzing the phase map using modeled data for determining one or more parameters of the structure.Type: GrantFiled: February 23, 2015Date of Patent: August 7, 2018Assignee: NOVA MEASURING INSTRUMENTS LTD.Inventors: Gilad Barak, Dror Shafir, Danny Grossman
-
Patent number: 9927370Abstract: A control system and method are provided for use in managing optical measurements on target structures. The control system comprises: data input utility for receiving input data indicative of a size of a target structure to be measured and input data indicative of illumination and collection channels of an optical measurement system; data processing utility for analyzing the input data, and an interplay of Point Spread Functions (PSFs) of the illumination and collection channels, and determining data indicative of optional tailoring of apertures to be used in the optical measurement system for optimizing ensquared energy for measurements on the given target structure, the optimal tailoring composing at least one of the following: an optimal ratio between numerical apertures of the illumination and collection channels; and an optimal orientation offset of physical apertures in the illumination and collection channels.Type: GrantFiled: October 5, 2016Date of Patent: March 27, 2018Assignee: NOVA MEASURING INSTRUMENTS LTD.Inventors: Danny Grossman, Guy Selickter
-
Publication number: 20170089842Abstract: A control system and method are provided for use in managing optical measurements on target structures. The control system comprises: data input utility for receiving input data indicative of a size of a target structure to be measured and input data indicative of illumination and collection channels of an optical measurement system; data processing utility for analyzing the input data, and an interplay of Point Spread Functions (PSFs) of the illumination and collection channels, and determining data indicative of optional tailoring of apertures to be used in the optical measurement system for optimizing ensquared energy for measurements on the given target structure, the optimal tailoring composing at least one of the following: an optimal ratio between numerical apertures of the illumination and collection channels; and an optimal orientation offset of physical apertures in the illumination and collection channels.Type: ApplicationFiled: October 5, 2016Publication date: March 30, 2017Inventors: Danny GROSSMAN, Guy SELICKTER
-
Publication number: 20170016835Abstract: A measurement system for use in measuring parameters of a patterned sample is presented. The system comprises: a broadband light source; an optical system configured as an interferometric system; a detection unit; and a control unit. The interferometric system defines illumination and detection channels having a sample arm and a reference arm comprising a reference reflector, and is configured for inducing an optical path difference between the sample and reference arms; the detection unit comprises a configured and operable for detecting a combined light beam formed by a light beam reflected from said reflector and a light beam propagating from a sample's support, and generating measured data indicative of spectral interference pattern formed by at least two spectral interference signatures. The control unit is configured and operable for receiving the measured data and applying a model-based processing to the spectral interference pattern for determining one or more parameters of the pattern in the sample.Type: ApplicationFiled: April 12, 2015Publication date: January 19, 2017Applicant: Nova Measuring Instruments Ltd.Inventors: Gilad BARAK, Danny GROSSMAN, Dror SHAFIR, Yoav BERLATZKY, Yanir HAINICK
-
Publication number: 20160363484Abstract: A metrology system is presented for measuring parameters of a structure. The system comprises: an optical system and a control unit. The optical system is configured for detecting light reflection of incident radiation from the structure and generating measured data indicative of angular phase of the detected light components corresponding to reflections of illuminating light components having different angles of incidence. The control unit is configured for receiving and processing the measured data and generating a corresponding phase map indicative of the phase variation along at least two dimensions, and analyzing the phase map using modeled data for determining one or more parameters of the structure.Type: ApplicationFiled: February 23, 2015Publication date: December 15, 2016Inventors: Gilad BARAK, Dror SHAFIR, Danny GROSSMAN