Patents by Inventor Danny R. Barnett

Danny R. Barnett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test probe alignment apparatus
    Patent number: 4266191
    Abstract: Test probe alignment apparatus for the alignment of test probes for testing integrated circuits includes three separate stages in which the theta stage is separate from the X-Y stage and the Z stage is separate from both the theta stage and the X-Y stage.
    Type: Grant
    Filed: April 18, 1979
    Date of Patent: May 5, 1981
    Inventors: John D. Spano, Danny R. Barnett