Patents by Inventor Danwu CHEN

Danwu CHEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • MACHINE LEARNING BASED IMAGE GENERATION FOR MODEL BASE ALIGNMENTS
    Publication number: 20260133499
    Abstract: A method for training a machine learning model to generate a predicted measured image, the method including obtaining (a) an input target image associated with a reference design pattern, and (b) a reference measured image associated with a specified design pattern printed on a substrate, wherein the input target image and the reference measured image are non-aligned images; and training, by a hardware computer system and using the input target image, the machine learning model to generate a predicted measured image.
    Type: Application
    Filed: January 7, 2026
    Publication date: May 14, 2026
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Qiang ZHANG, Yunbo GUO, Yu CAO, Jen-Shiang WANG, Yen-Wen LU, Danwu CHEN, Pengcheng YANG, Haoyi LIANG, Zhichao CHEN, Lingling PU
  • Machine learning based image generation for model base alignments
    Patent number: 12529966
    Abstract: A method for training a machine learning model to generate a predicted measured image, the method including obtaining (a) an input target image associated with a reference design pattern, and (b) a reference measured image associated with a specified design pattern printed on a substrate, wherein the input target image and the reference measured image are non-aligned images; and training, by a hardware computer system and using the input target image, the machine learning model to generate a predicted measured image.
    Type: Grant
    Filed: October 1, 2020
    Date of Patent: January 20, 2026
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Qiang Zhang, Yunbo Guo, Yu Cao, Jen-Shiang Wang, Yen-Wen Lu, Danwu Chen, Pengcheng Yang, Haoyi Liang, Zhichao Chen, Lingling Pu
  • Tonal vector determination for printing device control
    Patent number: 12517493
    Abstract: A method for determining a tonal vector for generating a control signal for a printing device includes providing a device-independent color value vector. The method includes transforming the device-independent color value vector into the tonal vector using a backward transformation. The method includes determining the backward transformation such that a cost function including an image difference metric term is minimized. The image difference metric term represents a difference between a reference image including device-independent color value vectors and a simulated image. The simulated image is determined by transforming an input image into a tonal image using the backward transformation and transforming the tonal image into the simulated image by using a forward transformation.
    Type: Grant
    Filed: January 26, 2023
    Date of Patent: January 6, 2026
    Assignee: Fraunhofer Gesellschaft zur Förderung der angewandten Forschung e.V.
    Inventors: Danwu Chen, Johann Reinhard, Philipp Urban
  • Tonal Vector Determination for Printing Device Control
    Publication number: 20230236570
    Abstract: A method for determining a tonal vector for generating a control signal for a printing device includes providing a device-independent color value vector. The method includes transforming the device-independent color value vector into the tonal vector using a backward transformation. The method includes determining the backward transformation such that a cost function including an image difference metric term is minimized. The image difference metric term represents a difference between a reference image including device-independent color value vectors and a simulated image. The simulated image is determined by transforming an input image into a tonal image using the backward transformation and transforming the tonal image into the simulated image by using a forward transformation.
    Type: Application
    Filed: January 26, 2023
    Publication date: July 27, 2023
    Inventors: Danwu Chen, Johann Reinhard, Philipp Urban
  • MACHINE LEARNING BASED IMAGE GENERATION FOR MODEL BASE ALIGNMENTS
    Publication number: 20220404712
    Abstract: A method for training a machine learning model to generate a predicted measured image, the method including obtaining (a) an input target image associated with a reference design pattern, and (b) a reference measured image associated with a specified design pattern printed on a substrate, wherein the input target image and the reference measured image are non-aligned images; and training, by a hardware computer system and using the input target image, the machine learning model to generate a predicted measured image.
    Type: Application
    Filed: October 1, 2020
    Publication date: December 22, 2022
    Applicant: ASML NETHERLANDS B.V
    Inventors: Qiang ZHANG, Yunbo GUO, Yu CAO, Jen-Shiang WANG, Yen-Wen LU, Danwu CHEN, Pengcheng YANG, Haoyi LIANG, Zhichao CHEN, Lingling PU