Patents by Inventor Daojie LI

Daojie LI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9893206
    Abstract: The present disclosure provides a TFT, an array substrate, their manufacturing methods, and a display device. A source electrode and a drain electrode of the TFT are each of a multi-layered structure including a metal layer and a metal barrier layer. An a-Si active layer of the TFT is covered with an etch stop layer, via-holes penetrating through the etch stop layer are provided at positions corresponding to the source electrode and the drain, and the source electrode and the drain electrode are connected to the a-Si active layer through the via-holes.
    Type: Grant
    Filed: May 4, 2016
    Date of Patent: February 13, 2018
    Assignees: BOE TECHNOLOGY GROUP CO., LTD., HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Yuliang Wang, Daeyoung Choi, Zengli Liu, Daojie Li, Fei Al, Jun Zhou
  • Patent number: 9698178
    Abstract: A method for manufacturing an array substrate includes coating a photoresist onto an insulation layer including a gate insulation layer and an etch stop layer, wherein the gate insulation layer covers a conductive pattern and the etch stop layer covers a semiconductive pattern. The method further includes exposing the photoresist to form a photoresist partially-reserved region and a photoresist unreserved region. The method further includes performing a first etching process to at least partially remove a portion of the insulation layer located at a position corresponding to the photoresist unreserved region, to form an intermediate hole. The method further includes performing a second etching process to form the first via hole and form the second via hole at a position of the intermediate hole, thereby to reveal the semiconductive pattern and the conductive pattern at positions corresponding to the first via hole and the second via hole, respectively.
    Type: Grant
    Filed: April 30, 2015
    Date of Patent: July 4, 2017
    Assignees: BOE TECHNOLOGY GROUP CO., LTD., HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Yuliang Wang, Daeyoung Choi, Zengli Liu, Daojie Li, Shijuan Chen
  • Publication number: 20160351726
    Abstract: The present disclosure provides a TFT, an array substrate, their manufacturing methods, and a display device. A source electrode and a drain electrode of the TFT are each of a multi-layered structure including a metal layer and a metal barrier layer. An a-Si active layer of the TFT is covered with an etch stop layer, via-holes penetrating through the etch stop layer are provided at positions corresponding to the source electrode and the drain, and the source electrode and the drain electrode are connected to the a-Si active layer through the via-holes.
    Type: Application
    Filed: May 4, 2016
    Publication date: December 1, 2016
    Applicants: BOE TECHNOLOGY GROUP CO., LTD., HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Yuliang WANG, Daeyoung CHOI, Zengli LIU, Daojie LI, Fei AI, Jun ZHOU
  • Publication number: 20160343748
    Abstract: A method for manufacturing an array substrate includes steps of: coating a photoresist onto an insulation layer covered with a conductive pattern and/or a semiconductive pattern; exposing the photoresist to form at least a photoresist partially-reserved region corresponding to a region where a first via hole is formed, and a photoresist unreserved region corresponding to a region where a second via hole is formed; performing a first etching process so as to at least partially remove a portion of the insulation layer located at a position corresponding to the photoresist unreserved region, thereby to form an intermediate hole; and performing a second etching process, so as to form the first via hole, and form the second via hole at a position of the intermediate hole, thereby to reveal the semiconductive pattern and/or the conductive pattern at positions corresponding to the first via hole and the second via hole, respectively.
    Type: Application
    Filed: April 30, 2015
    Publication date: November 24, 2016
    Applicants: BOE TECHNOLOGY GROUP CO., LTD., HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD .
    Inventors: Yuliang WANG, Daeyoung CHOI, Zengli LIU, Daojie LI, Shijuan CHEN