Patents by Inventor Daoru Li

Daoru Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12499023
    Abstract: Methods, apparatus, and processor-readable storage media for determining configurations to be used in system testing processes using machine learning techniques are provided herein. An example computer-implemented method includes obtaining, from multiple data sources, configuration information associated with at least one system; filtering out a subset of the configuration information based at least in part on at least one user request related to testing of at least a portion of the at least one system; determining at least a portion of the subset of the configuration information to be used in the testing of the at least a portion of the at least one system by processing the subset of the configuration information using one or more machine learning techniques; and performing one or more automated actions based on the determined at least a portion of the subset of the configuration information to be used in the testing.
    Type: Grant
    Filed: September 20, 2023
    Date of Patent: December 16, 2025
    Assignee: Dell Products L.P.
    Inventors: Rajasekaran Rajagopal, Nir Harel, Daoru Li
  • Publication number: 20250094299
    Abstract: Methods, apparatus, and processor-readable storage media for determining configurations to be used in system testing processes using machine learning techniques are provided herein. An example computer-implemented method includes obtaining, from multiple data sources, configuration information associated with at least one system; filtering out a subset of the configuration information based at least in part on at least one user request related to testing of at least a portion of the at least one system; determining at least a portion of the subset of the configuration information to be used in the testing of the at least a portion of the at least one system by processing the subset of the configuration information using one or more machine learning techniques; and performing one or more automated actions based on the determined at least a portion of the subset of the configuration information to be used in the testing.
    Type: Application
    Filed: September 20, 2023
    Publication date: March 20, 2025
    Inventors: Rajasekaran Rajagopal, Nir Harel, Daoru Li