Abstract: An integrated circuit system and program product for predicting yield of a VLSI design. An integrated circuit system is provided including a system for identifying and grouping sub-circuits contained within an integrated circuit design by circuit type; a critical area calculation system for determining critical area values for different regions, wherein each different region is associated with a circuit type; a tallying system for calculating a plurality of tallies of critical area values based on circuit type; and a plurality of modeling subsystems for separately modeling each of the plurality of tallies based on circuit type.

Abstract: A method for implementing an ORC process to facilitate physical verification of an integrated circuit (IC) graphical design. The method includes partitioning the IC graphical design data into files by a host machine such that the files correspond to regions of interest or partitions with defined margins, dispersing the partitioned data files to available cpus within the network, processing of each job by the cpu receiving the file, wherein artifacts arising from bisection of partitioning margins during the partitioning, including cut-induced false errors, are detected and removed, and the shape-altering effects of such artifact errors are minimized and transmitting the results of processing at each cpu to the host machine for aggregate processing.

Abstract: An integrated circuit and program product for predicting yield of a VLSI design. An integrated circuit is provided including a system for identifying and grouping sub-circuits contained within an integrated circuit design by circuit type; a critical area calculation system for determining critical area values for different regions, wherein each different region is associated with a circuit type; a tallying system for calculating a plurality of tallies of critical area values based on circuit type; and a plurality of modeling subsystems for separately modeling each of the plurality of tallies based on circuit type.

Abstract: A system, method and program product for predicting yield of a VLSI design. A method is provided including the steps of: identifying and grouping sub-circuits contained within an integrated circuit design by type; calculating critical area values for regions within the integrated circuit design; and applying different yield models to critical area values based on the types of the regions used to calculate the critical area values, wherein each yield model is dependent on a type.

Abstract: A method for implementing an ORC process to facilitate physical verification of an integrated circuit (IC) graphical design. The method includes partitioning the IC graphical design data into files by a host machine such that the files correspond to regions of interest or partitions with defined margins, dispersing the partitioned data files to available cpus within the network, processing of each job by the cpu receiving the file, wherein artifacts arising from bisection of partitioning margins during the partitioning, including cut-induced false errors, are detected and removed, and the shape-altering effects of such artifact errors are minimized and transmitting the results of processing at each cpu to the host machine for aggregate processing.

Abstract: A system and method for visualizing data. Data are provided either in the form of data values of a data array or in the form of a geometric representation. A data array may be, for example, a sparse matrix. A geometric representation, may be, for example, an integrated circuit layout coded in a geometric description language. Data provided in the form of data values are associated with geometric shapes placed on a grid. Information placed on the grid is then reported to a user. If data are provided in the form of a geometric representation, then data values are extracted from the geometric representation. A graphic representation is generated from the extracted data values. The graphic representation is exhibited to a user.

Abstract: Disclosed is a method and structure that partitions an integrated circuit design by identifying logical blocks within the integrated circuit design based on size heuristics of logical macros in the design hierarchy. The invention determines whether the number of logical blocks is within a range of desired number of logical blocks and repeats the process of identifying logical blocks for different hierarchical levels of the integrated circuit design until the number of logical blocks is within the range of the desired number of logical blocks. This serves as a guide to partition the chip as opposed to a grid-like partitioning.

Abstract: The present invention divides a large graphics file into smaller “frames” of graphics files. The division process is preferably load balanced amongst any number of processors. This allows many processors to be used in parallel to divide the large graphics file and to then process the smaller output frames. Additionally, the load balancing is performed in such a manner that only portions of the graphics file need be loaded by any one processor. This saves memory and computational requirements. Preferably, the graphics file is divided in a three-dimensional manner, such that any one processor will be assigned one three-dimensional block or volume of the graphics file. The three-dimensional partition of the graphics file will become one frame, and the one processor accesses the graphics file to copy its three-dimensional partition into the new output frame.

Abstract: A method is provided for designing an integrated circuit that includes receiving a graphical description of the integrated circuit, extracting shapes relating to a specific circuit function from the graphical description of the integrated circuit, and partitioning the extracted shapes into a plurality of segments. The method may form an electrical representation of the integrated circuit for each of the plurality of segments and solve a matrix equation (Gv=i) for each of the plurality of segments based on the electrical representation.

Abstract: A system and method for visualizing data. Data are provided either in the form of data values of a data array or in the form of a geometric representation. A data array may be, for example, a sparse matrix. A geometric representation, may be, for example, an integrated circuit layout coded in a geometric description language. Data provided in the form of data values are associated with geometric shapes placed on a grid. Information placed on the grid is then reported to a user. If data are provided in the form of a geometric representation, then data values are extracted from the geometric representation. A graphic representation is generated from the extracted data values. The graphic representation is exhibited to a user.

Abstract: A method for manufacturing an integrated circuit having improved defect-limited yield. Each conductor on the integrated circuit is represented as an electrical element of a network, having branch voltages and currents. The width of the conductor is advantageously selected to have the minimum width necessary to produce signal levels that have sufficient noise margins. An integrated circuit conductive grid is thus realized having a reduced cross sectional area along a portion of various conductor element lengths, to reduce the risk that particles produced during manufacturing will result in bridging of adjacent conductor elements.