Abstract: A method for generating a functional test for a loaded printed circuit board automatically generates a test for a cluster of elements which may be tested together as a functional unit by pattern matching with pre-defined cluster models contained in a library. The method includes the following steps. First, an electrical description of the printed circuit board is analyzed to identify any clusters of elements which match any pre-defined cluster models. When a match is found, a generic test routine is retrieved from the model and used to generate a functional test for the cluster of elements on the printed circuit board. Thereafter, tests are generated for remaining, non-clustered devices by matching each device to a generic model within a device models library, and then retrieving a generic test routine therefrom.

Abstract: A method for automatically generating an in-circuit board test for a circuit board, comprising a plurality of Interconnected digital devices, selectively provides conditioning only to devices which need conditioning. Devices which need conditioning include outputs which should be conditioned prior to being back-driven and problem devices (such as oscillators) which interfere with the testing of other devices. The device outputs which require conditioning are flagged in a device models library which contains predetermined generic test models for the devices on the board.

Abstract: A method for use in an in-circuit tester automatically determines which test sequences must be regenerated as a result of a board modification, and automatically regenerates only the test sequences affected by the modification.