Patents by Inventor Darren C. Nolet

Darren C. Nolet has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Wireline system for multiple direct push tool usage
    Patent number: 6644423
    Abstract: A tool latching and retrieval system allows the deployment and retrieval of a variety of direct push subsurface characterization tools through an embedded rod string during a single penetration without requiring withdrawal of the string from the ground. This enables the in situ interchange of different tools, as well as the rapid retrieval of soil core samples from multiple depths during a single direct push penetration. The system includes specialized rods that make up the rod string, a tool housing which is integral to the rod string, a lock assembly, and several tools which mate to the lock assembly.
    Type: Grant
    Filed: July 27, 2001
    Date of Patent: November 11, 2003
    Assignee: Applied Research Associates, Inc.
    Inventors: Wesley L. Bratton, Stephen P. Farrington, James D. Shinn, II, Darren C. Nolet
  • Wireline system for multiple direct push tool usage
    Publication number: 20020020560
    Abstract: A tool latching and retrieval system allows the deployment and retrieval of a variety of direct push subsurface characterization tools through an embedded rod string during a single penetration without requiring withdrawal of the string from the ground. This enables the in situ interchange of different tools, as well as the rapid retrieval of soil core samples from multiple depths during a single direct push penetration. The system includes specialized rods that make up the rod string, a tool housing which is integral to the rod string, a lock assembly, and several tools which mate to the lock assembly.
    Type: Application
    Filed: July 27, 2001
    Publication date: February 21, 2002
    Inventors: Wesley L. Bratton, Stephen P. Farrington, James D. Shinn, Darren C. Nolet