Patents by Inventor Daryl E. Diehl

Daryl E. Diehl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for quality and reliability assurance testing of integrated circuits using differential Iddq screening in lieu of burn-in
    Patent number: 6230293
    Abstract: A method for quality and reliability assurance testing a lot of fabricated ICs comprising the steps of testing the differential Iddq of a sample of ICs at a plurality of different voltages, burning-in a sample of ICs, and then testing the functionality of the sample of ICs. The method of the present invention enables the reliability of an entire lot of ICs to be tested by determining an effective screening voltage for differential Iddq testing of the ICs, thereby eliminating the need both to burn-in and conduct post burn-in testing of all future lots of the ICs. The method of the present invention also enables fabrication facilities and workers to be engaged in other tasks rather than testing of ICs.
    Type: Grant
    Filed: July 24, 1998
    Date of Patent: May 8, 2001
    Assignee: Lucent Technologies Inc.
    Inventors: Sailesh Chittipeddi, Daryl E. Diehl, Thomas N. Hofacker, Richard J. Jenkins, Mamata Patnaik, Robert T. Smith, Michael J. Toth, Keelathur N. Vasudevan, Michael Washko