Abstract: Time-slot interchange (TSI) switches and a pipelined data memory address generation circuit are provided. The TSI switches and the pipelined data memory address generation circuit include a first pipeline stage that reads data from a connection memory. A second pipeline stage compares the data read from the connection memory to provide a bank selection value. Optionally, a third pipeline stage reads data from a data memory based on the bank selection value and the data read from connection memory. The timing of the pipeline stages may be adjusted such that the duration of the first pipeline stage is extended and the duration of the second pipeline stage shortened.

Abstract: Time-slot interchange (TSI) switches and a pipelined data memory address generation circuit are provided. The TSI switches and the pipelined data memory address generation circuit include a first pipeline stage that reads data from a connection memory. A second pipeline stage compares the data read from the connection memory to provide a bank selection value. Optionally, a third pipeline stage reads data from a data memory based on the bank selection value and the data read from connection memory. The timing of the pipeline stages may be adjusted such that the duration of the first pipeline stage is extended and the duration of the second pipeline stage shortened.

Abstract: Time-slot interchange switches include measurement circuits that automatically measure frame alignment associated with a plurality of multi-frame data streams received by the switch. Internal programming circuits are also provided to convert the frame alignment measurements into frame offsets. Unacceptable frame offsets are also automatically identified using error control circuitry. These measurement and programming circuits streamline frame offset measurement techniques and enable on-chip measurement and conversion of frame delays to frame offsets and programming of frame offset registers (FORs).