Patents by Inventor Dave Riendeau

Dave Riendeau has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test and characterization of source synchronous AC timing specifications by trace length modulation of accurately controlled interconnect topology of the test unit interface
    Patent number: 6449742
    Abstract: An apparatus that can determine whether a Tva parameter and a Tvb parameter of a device under test (DUT) complies with a design specification where the device under test is coupled to a secondary device. The Tvb parameter corresponds to a setup time of the secondary device. The Tva parameter corresponds to the hold time of the secondary device. The apparatus allows the DUT to be coupled to a secondary device that normally operates with the DUT. The apparatus writes data to the DUT and secondary device. The data is then written back to the apparatus which then determines whether the DUT complies with the Tvb and Tva design specifications. The apparatus may also implement tunable delay circuits to compensate for different setup and hold times of the secondary device.
    Type: Grant
    Filed: August 11, 1999
    Date of Patent: September 10, 2002
    Assignee: Intel Corporation
    Inventors: Tawfik Arabi, Dave Riendeau, Srirama Pedarla, Greg Eberlein, Gary Andrew