Patents by Inventor David A. Holaday

David A. Holaday has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10670632
    Abstract: A test and measurement instrument can include an input to receive an analog signal, a sampler to produce digital sample data corresponding to the analog signal, a buffer to store a portion of the sample data, a memory to store sample data from the buffer, a plurality of comparators to establish a vertical range, and a controller configured to configure the plurality of comparators to establish a first vertical range based on sample data in the buffer, and determine whether any of the sample data in the buffer transitions outside the first vertical range during a period of time.
    Type: Grant
    Filed: April 13, 2018
    Date of Patent: June 2, 2020
    Assignee: Tektronix, Inc.
    Inventors: David A. Holaday, Joshua J. O'Brien
  • Publication number: 20180299491
    Abstract: A test and measurement instrument can include an input to receive an analog signal, a sampler to produce digital sample data corresponding to the analog signal, a buffer to store a portion of the sample data, a memory to store sample data from the buffer, a plurality of comparators to establish a vertical range, and a controller configured to configure the plurality of comparators to establish a first vertical range based on sample data in the buffer, and determine whether any of the sample data in the buffer transitions outside the first vertical range during a period of time.
    Type: Application
    Filed: April 13, 2018
    Publication date: October 18, 2018
    Inventors: David A. Holaday, Joshua J. O'Brien
  • Patent number: 7466724
    Abstract: A method and apparatus for processing packetized data spanning multiple clock cycles includes at least one comparator, for comparing a present clock cycle count to a reference clock cycle count, wherein the reference clock cycle values may be anywhere within the packet and may be non-contiguous with other reference clock cycle values. At least one word recognizer, compares a presently clocked word to a reference word, and an output circuit provides an indication of a favorable word comparison that occurred in response to a favorable clock cycle count comparison.
    Type: Grant
    Filed: October 14, 2004
    Date of Patent: December 16, 2008
    Assignee: Tektronix, Inc.
    Inventors: David A. Holaday, Geoffrey D. Cheren
  • Patent number: 7272528
    Abstract: A test and measurement instrument such as a Logic Analyzer, or the like, has at least one Reloadable Word Recognizer whose reference value can be loaded by a trigger machine with a current acquired data sample while data is being acquired. In a second embodiment useful for performing memory testing, the reloadable word recognizer is used in cooperation with two conventional word recognizers. In a third embodiment, a delay unit is employed to provide delayed input data words as reference words. In a fourth embodiment, an offset register and adder are used to modify the input data words before storing them. A fifth embodiment provides for substantially immediate use of base addresses of relocatable subroutines and stack-based variables recovered from a data stream acquired from a system under test.
    Type: Grant
    Filed: September 23, 2002
    Date of Patent: September 18, 2007
    Assignee: Tektronix, Inc.
    Inventors: David A. Holaday, Gary K. Richmond, Donald C. Kirkpatrick
  • Patent number: 7193505
    Abstract: A word recognizer for providing a channel-to-channel compare for an input digital signal divides channels of the input digital signal into equal-width input signal channel paths. One input signal channel path serves as a reference value for comparison with the other input signal channel path to produce the channel-to-channel compare.
    Type: Grant
    Filed: September 9, 2004
    Date of Patent: March 20, 2007
    Assignee: Tektronix, Inc.
    Inventor: David A. Holaday
  • Publication number: 20060083268
    Abstract: A method and apparatus for processing packetized data spanning multiple clock cycles includes at least one comparator, for comparing a present clock cycle count to a reference clock cycle count, wherein the reference clock cycle values may be anywhere within the packet and may be non-contiguous with other reference clock cycle values. At least one word recognizer, compares a presently clocked word to a reference word, and an output circuit provides an indication of a favorable word comparison that occurred in response to a favorable clock cycle count comparison.
    Type: Application
    Filed: October 14, 2004
    Publication date: April 20, 2006
    Inventors: David Holaday, Geoffrey Cheren
  • Publication number: 20060049919
    Abstract: A word recognizer for providing a channel-to-channel compare for an input digital signal divides channels of the input digital signal into equal-width input signal channel paths. One input signal channel path serves as a reference value for comparison with the other input signal channel path to produce the channel-to-channel compare.
    Type: Application
    Filed: September 9, 2004
    Publication date: March 9, 2006
    Inventor: David Holaday
  • Patent number: 6895536
    Abstract: A logic analyzer according to the subject invention employs a bi-directional counter that can be incremented in response to detection of certain events, and decremented in response to detection of other, different, events. Both an overflow (incremented to a predetermined count) and an underflow (decremented to a predetermined count) can be tested by a trigger machine of the Logic Analyzer.
    Type: Grant
    Filed: September 23, 2002
    Date of Patent: May 17, 2005
    Assignee: Tektronix, Inc.
    Inventors: David A. Holaday, Gary K. Richmond
  • Patent number: 6640320
    Abstract: An electronic system includes a source of test data, which, if the test data source is operating properly, is a pattern of a limited number of data words successively repeated. A memory device is coupled to the test data source and stores the test data. A memory test circuit compares the stored test data to successively repeated pattern data words and generates a signal to indicate whether the stored test data is the same as the successively repeated pattern data words.
    Type: Grant
    Filed: August 29, 2000
    Date of Patent: October 28, 2003
    Assignee: Tektronix, Inc.
    Inventor: David A. Holaday
  • Publication number: 20030070125
    Abstract: A logic analyzer according to the subject invention employs a bi-directional counter that can be incremented in response to detection of certain events, and decremented in response to detection of other, different, events. Both an overflow (incremented to a predetermined count) and an underflow (decremented to a predetermined count) can be tested by a trigger machine of the Logic Analyzer.
    Type: Application
    Filed: September 23, 2002
    Publication date: April 10, 2003
    Inventors: David A. Holaday, Gary K. Richmond
  • Publication number: 20030065500
    Abstract: A test and measurement instrument such as a Logic Analyzer, or the like, has at least one Reloadable Word Recognizer whose reference value can be loaded by a trigger machine with a current acquired data sample while data is being acquired. In a second embodiment useful for performing memory testing, the reloadable word recognizer is used in cooperation with two conventional word recognizers. In a third embodiment, a delay unit is employed to provide delayed input data words as reference words. In a fourth embodiment, an offset register and adder are used to modify the input data words before storing them. A fifth embodiment provides for substantially immediate use of base addresses of relocatable subroutines and stack-based variables recovered from a data stream acquired from a system under test.
    Type: Application
    Filed: September 23, 2002
    Publication date: April 3, 2003
    Inventors: David A. Holaday, Gary K. Richmond, Donald C. Kirkpatrick
  • Patent number: 6473700
    Abstract: In a logic analyzer or similar binary signal-analyzing instrument, hardware circuitry, such as an ASIC, or other dedicated hardware, is used to perform waveform compression and summarization more rapidly than it could be done by software alone. The hardware is used to perform the compression of the data and to summarize its behavior for visual display. In one embodiment, the hardware starts from a given memory address and compares current timestamp values with final timestamp values to determine the length of the timeslice. Within the timeslice, all of the data is compared to determine whether it remains the same throughout the timeslice or whether it changes. The same approach can be used on violation data, such as glitches and setup and hold violations.
    Type: Grant
    Filed: March 14, 2000
    Date of Patent: October 29, 2002
    Assignee: Tektronix, Inc.
    Inventors: David A. Holaday, Ken N. Nguyen, Glenn R. Johnson