Patents by Inventor David A. Krantz

David A. Krantz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for utilizing shape analysis to assess fetal abnormality
    Patent number: 7780600
    Abstract: A method and system for utilizing shape analysis to assess fetal abnormality. According to one embodiment, coordinates of points identifying a shape in a fetal image are received, coefficients of one or more mathematical functions that describe the identified shape are determined, and the determined coefficients are utilized as markers to assess fetal abnormality.
    Type: Grant
    Filed: July 17, 2007
    Date of Patent: August 24, 2010
    Assignee: NTD Laboratories, Inc.
    Inventors: David A. Krantz, Francesco Orlandi
  • System and method for assessing fetal abnormality based on landmarks
    Patent number: 7343190
    Abstract: A method and system for assessing fetal abnormality based on landmarks. According to one embodiment, at least two coordinates are received for each of a plurality of points identifying a configuration of landmarks in a fetal image, and any of the received coordinates of any of the plurality of points are utilized as markers to assess fetal abnormality. According to another embodiment, at least two coordinates are received for each of a plurality of points identifying a configuration of landmarks in a fetal image, and one or more values resulting from a linear combination of any of the received coordinates of any of the plurality of points are utilized as markers to assess fetal abnormality.
    Type: Grant
    Filed: July 28, 2004
    Date of Patent: March 11, 2008
    Assignee: NTD Laboratories, Inc.
    Inventors: David A. Krantz, Francesco Orlandi, Vincent James Macri
  • System and method for utilizing shape analysis to assess fetal abnormality
    Patent number: 7244233
    Abstract: A method and system for utilizing shape analysis to assess fetal abnormality. According to one embodiment, coordinates of points identifying a shape in a fetal image are received, coefficients of one or more mathematical functions that describe the identified shape are determined, and the determined coefficients are utilized as markers to assess fetal abnormality.
    Type: Grant
    Filed: March 25, 2004
    Date of Patent: July 17, 2007
    Assignee: NTD Laboratories, Inc.
    Inventors: David A. Krantz, Francesco Orlandi