Patents by Inventor David A. Mittelman

David A. Mittelman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240086721
    Abstract: Systems, methods, and computer-readable storage media for comparing genetic data of at least two individuals to determine a relationship between the at least two individuals and to present the relationship while providing privacy protection of certain genetic data. One system includes a one or more processing circuits to receive at least a portion of a first genetic dataset and at least a portion of a second genetic dataset. Further, the one or more processing circuits to identify a first set of DNA markers and identify a second set of DNA markers, and wherein the first set of DNA markers and the second set of DNA markers at least partially correspond. Further, the one or more processing circuits to determine a plurality of relationship indices, generate a relationship interface that includes graphical representations, and provide the relationship interface.
    Type: Application
    Filed: July 28, 2023
    Publication date: March 14, 2024
    Applicant: Othram, Inc.
    Inventors: Lee C. Baker, David A. Mittelman, John W. Fondon, III
  • Patent number: 9916416
    Abstract: A system and method for genotyping tandem repeats in sequencing data. The invention uses Bayesian model selection guided by an empirically-derived error model that incorporates properties of sequence reads and reference sequences to which they map.
    Type: Grant
    Filed: October 18, 2013
    Date of Patent: March 13, 2018
    Assignee: VIRGINIA TECH INTELLECTUAL PROPERTIES, INC.
    Inventors: David A. Mittelman, Christopher T. Franck
  • Publication number: 20140114582
    Abstract: A system and method for genotyping tandem repeats in sequencing data. The invention uses Bayesian model selection guided by an empirically-derived error model that incorporates properties of sequence reads and reference sequences to which they map.
    Type: Application
    Filed: October 18, 2013
    Publication date: April 24, 2014
    Inventors: David A. Mittelman, Christopher T. Franck