Patents by Inventor David A. Peeters

David A. Peeters has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7492864
    Abstract: Methods and apparatus are disclosed for automatically setting an X-Ray strength based at least in part on the volume of an object. Lasers are used to measure distances to the object. Using the measured distances, a volume of the object to be X-Rayed is estimated. Using the estimated volume, an appropriate X-Ray strength is determined and an X-Ray machine is adjusted to provide X-Rays of that strength.
    Type: Grant
    Filed: August 1, 2007
    Date of Patent: February 17, 2009
    Assignee: Siemens Medical Solutions USA, Inc.
    Inventor: David Peeters
  • Publication number: 20080170657
    Abstract: Methods and apparatus are disclosed for automatically setting an X-Ray strength based at least in part on the volume of an object. Lasers are used to measure distances to the object. Using the measured distances, a volume of the object to be X-Rayed is estimated. Using the estimated volume, an appropriate X-Ray strength is determined and an X-Ray machine is adjusted to provide X-Rays of that strength.
    Type: Application
    Filed: August 1, 2007
    Publication date: July 17, 2008
    Applicant: Siemens Medical Solution USA, Inc.
    Inventor: David Peeters
  • Patent number: 6393592
    Abstract: A scan flop cell and method for making the scan flop cell are provided. The scan flop cell includes a D flip-flop, a scan multiplexer, and a clock multiplexer. The clock multiplexer is configured to receive a functional clock and a scan clock. A scan mode terminal SM is connected to the scan multiplexer to control the clock output of the clock multiplexer. The scan flop cell also preferably includes a data terminal D, a scan input terminal SI, a scan enable terminal SE, a functional clock terminal C, a scan clock terminal SC, and the scan mode terminal SM. Still further, the scan flop cell can be integrated with asynchronous set and/or reset blocking circuitry, which internally converts the asynchronous set and/or reset into synchronous set and/or reset signals.
    Type: Grant
    Filed: May 21, 1999
    Date of Patent: May 21, 2002
    Assignee: Adaptec, Inc.
    Inventors: David A. Peeters, Kewi-Yao Peng
  • Patent number: 5831472
    Abstract: An integrated circuit is provided which allows tracking and compensation for shifts in a line receiver's input threshold caused by manufacturing process parameter and temperature variations. The circuit includes an input threshold reference circuit which develops a steady-state input threshold, the same as the input threshold of a line receiver circuit. The steady-state input threshold value is compared to a design reference value, implemented as a resistive voltage divider, which is insensitive to manufacturing process parameter and temperature variations. Input threshold references and reference voltages are compared and, depending on the magnitude and polarity of the difference between the steady-state input threshold and its design value, additional pull-up or pull-down transistors are switched into the conduction leg of the line receiver, in order to adjust the line receiver's input threshold to a value within the design input threshold margin budget.
    Type: Grant
    Filed: March 31, 1997
    Date of Patent: November 3, 1998
    Assignee: Adaptec, Inc.
    Inventors: Paul P. S. Wang, Alan M. Yoshida, David A. Peeters