Patents by Inventor David A. Rauth

David A. Rauth has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10352877
    Abstract: A method of determining a physical characteristic of an adhesive material on a semiconductor device element using structured light is provided. The method includes the steps of: (1) applying a structured light pattern to an adhesive material on a semiconductor device element; (2) creating an image of the structured light pattern using a camera; and (3) analyzing the image of the structured light pattern to determine a physical characteristic of the adhesive material. Additional methods and systems for determining physical characteristics of semiconductor devices and elements using structured light are also provided.
    Type: Grant
    Filed: October 18, 2017
    Date of Patent: July 16, 2019
    Assignee: KULICKE AND SOFFA INDUSTRIES, INC
    Inventors: Deepak Sood, Zhijie Wang, Thomas J. Colosimo, Jr., David A. Rauth, Shu-Guo Tang
  • Publication number: 20180038806
    Abstract: A method of determining a physical characteristic of an adhesive material on a semiconductor device element using structured light is provided. The method includes the steps of: (1) applying a structured light pattern to an adhesive material on a semiconductor device element; (2) creating an image of the structured light pattern using a camera; and (3) analyzing the image of the structured light pattern to determine a physical characteristic of the adhesive material. Additional methods and systems for determining physical characteristics of semiconductor devices and elements using structured light are also provided.
    Type: Application
    Filed: October 18, 2017
    Publication date: February 8, 2018
    Inventors: Deepak Sood, Zhijie Wang, Thomas J. Colosimo, JR., David A. Rauth, Shu-Guo Tang
  • Patent number: 9810641
    Abstract: A method of determining a physical characteristic of an adhesive material on a semiconductor device element using structured light is provided. The method includes the steps of: (1) applying a structured light pattern to an adhesive material on a semiconductor device element; (2) creating an image of the structured light pattern using a camera; and (3) analyzing the image of the structured light pattern to determine a physical characteristic of the adhesive material. Additional methods and systems for determining physical characteristics of semiconductor devices and elements using structured light are also provided.
    Type: Grant
    Filed: August 27, 2014
    Date of Patent: November 7, 2017
    Assignee: Kulicke & Soffa Industries, Inc.
    Inventors: Deepak Sood, Zhijie Wang, Thomas J. Colosimo, Jr., David A. Rauth, Shu-Guo Tang
  • Publication number: 20150059957
    Abstract: A method of determining a physical characteristic of an adhesive material on a semiconductor device element using structured light is provided. The method includes the steps of: (1) applying a structured light pattern to an adhesive material on a semiconductor device element; (2) creating an image of the structured light pattern using a camera; and (3) analyzing the image of the structured light pattern to determine a physical characteristic of the adhesive material. Additional methods and systems for determining physical characteristics of semiconductor devices and elements using structured light are also provided.
    Type: Application
    Filed: August 27, 2014
    Publication date: March 5, 2015
    Inventors: Deepak Sood, Zhijie Wang, Thomas J. Colosimo, JR., David A. Rauth, Shu-Guo Tang