Patents by Inventor David A. Ringheiser

David A. Ringheiser has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12388697
    Abstract: Embodiments regard techniques for mitigating radio frequency interference (RFI) in weather data. A method includes receiving raw pulse returns, censoring the raw pulse returns to alter data of the raw pulse returns that is affected by the RFI resulting in censored pulse returns, compressing the censored pulse returns resulting in censored, compressed pulse returns, and transmitting, by an antenna, the censored, compressed pulse returns.
    Type: Grant
    Filed: February 6, 2023
    Date of Patent: August 12, 2025
    Assignee: Raytheon Company
    Inventors: David A. Ringheiser, Eric J. Knapp, Michael D. Dubois
  • Publication number: 20240267271
    Abstract: Embodiments regard techniques for mitigating radio frequency interference (RFI) in weather data. A method includes receiving raw pulse returns, censoring the raw pulse returns to alter data of the raw pulse returns that is affected by the RFI resulting in censored pulse returns, compressing the censored pulse returns resulting in censored, compressed pulse returns, and transmitting, by an antenna, the censored, compressed pulse returns.
    Type: Application
    Filed: February 6, 2023
    Publication date: August 8, 2024
    Inventors: David A. Ringheiser, Eric J. Knapp, Michael D. Dubois
  • Patent number: 11187786
    Abstract: An apparatus and method for enhanced calibration of radar at the module level supports dual polarization and array calibration and alignment without the use of external test equipment. Utilizing a delay line, loop back capability at the module level allows existing receiver exciter subsystem to be used for calibration. This approach eliminates the need for manual array calibration using external RF monitor subsystem or external test antennas.
    Type: Grant
    Filed: June 19, 2019
    Date of Patent: November 30, 2021
    Assignee: Raytheon Company
    Inventors: Debra J. Tonks, Stephen M. Sparagna, William Kennedy, David A. Ringheiser, Jack Lee
  • Publication number: 20200049798
    Abstract: An apparatus and method for enhanced calibration of radar at the module level supports dual polarization and array calibration and alignment without the use of external test equipment. Utilizing a delay line, loop back capability at the module level allows existing receiver exciter subsystem to be used for calibration. This approach eliminates the need for manual array calibration using external RF monitor subsystem or external test antennas.
    Type: Application
    Filed: June 19, 2019
    Publication date: February 13, 2020
    Applicant: Raytheon Company
    Inventors: Debra J. Tonks, Stephen M. Sparagna, William Kennedy, David A. Ringheiser, Jack Lee
  • Patent number: 10371798
    Abstract: An apparatus and method for enhanced calibration of radar at the module level supports dual polarization and array calibration and alignment without the use of external test equipment. Utilizing a delay line, loop back capability at the module level allows existing receiver exciter subsystem to be used for calibration. This approach eliminates the need for manual array calibration using external RF monitor subsystem or external test antennas.
    Type: Grant
    Filed: December 1, 2015
    Date of Patent: August 6, 2019
    Assignee: Raytheon Company
    Inventors: Debra J. Tonks, Stephen M. Sparagna, William Kennedy, David A. Ringheiser, Jack Lee
  • Publication number: 20170153317
    Abstract: An apparatus and method for enhanced calibration of radar at the module level supports dual polarization and array calibration and alignment without the use of external test equipment. Utilizing a delay line, loop back capability at the module level allows existing receiver exciter subsystem to be used for calibration. This approach eliminates the need for manual array calibration using external RF monitor subsystem or external test antennas.
    Type: Application
    Filed: December 1, 2015
    Publication date: June 1, 2017
    Inventors: Debra J. Tonks, Stephen M. Sparagna, William Kennedy, David A. Ringheiser, Jack Lee