Abstract: An external tire reader can be configured to read a tire tread. The external tire reader can include an offset structure, a camera system, and a controller. The offset structure can be configured to be applied to the tire tread. The camera system can be configured to generate an image of the tire tread while the offset structure is applied to the tire tread. The offset structure can be configured to provide a fixed distance between the camera system and the tire tread while the offset structure is applied to the tire tread. The controller can be coupled with the camera system. The controller can be configured to process the image of the tire received from the camera system.

Abstract: A tire monitoring system may include first and second sensor elements, a circuit board, and a housing. The circuit board includes control circuitry coupled with at least one of the first and second sensor elements, wherein the control circuitry is configured to generate tire tread information based on an electrical response of at least one of the first and second sensor elements. The housing includes a housing material that surrounds the circuit board in a direction parallel with respect to a surface of the circuit board. Related methods are also discussed.

Abstract: A system for measuring a tread of a tire can include a nonmagnetic layer, a frame, and a housing. The nonmagnetic layer can provide a drive-over surface adapted to receive the tire thereon including the tread to be measured. The frame can have a magnet and a magnetic sensor coupled thereto. The housing can include a cavity therein. The frame with the magnet and the magnetic sensor can be mounted in the cavity. The nonmagnetic layer can be provided on the housing and on the frame.

Abstract: Methods of measuring a thickness of a material are disclosed. An oscillating signal at a measurement frequency is applied to a circuit including an inductive component and a capacitive component provided using a pair of capacitive sensor electrodes adjacent the material. The measurement frequency is less than a resonant frequency of the circuit, and the resonant frequency is based on the inductive component and the capacitive component. Information regarding a value of a measured parameter is generated based on applying the oscillating signal at the measurement frequency to the circuit. A value of the measured parameter is related to the thickness of the material.

Abstract: According to some embodiments disclosed herein, a system is provided to measure a tread of a tire. The system includes a nonmagnetic layer providing a drive over surface, a magnet, and a magnetic sensor associated with the magnet. The drive over surface is adapted to receive the tire thereon including the tread to be measured. The magnet has opposing first and second magnetic poles, the nonmagnetic layer is between the drive over surface and the magnet, and the magnet is arranged so that the first magnetic pole is between the second magnetic pole and the nonmagnetic layer. The nonmagnetic layer is between the drive over surface and the magnetic sensor, and the magnetic sensor is configured to detect a magnetic field resulting from the magnet and the tire on the drive over surface.

Abstract: A tire monitoring system may include first and second sensor elements, a circuit board, and a housing. The circuit board includes control circuitry coupled with at least one of the first and second sensor elements, wherein the control circuitry is configured to generate tire tread information based on an electrical response of at least one of the first and second sensor elements. The housing includes a housing material that surrounds the circuit board in a direction parallel with respect to a surface of the circuit board. Related methods are also discussed.

Abstract: Methods of measuring a thickness of a material are disclosed. An oscillating signal at a measurement frequency is applied to a circuit including an inductive component and a capacitive component provided using a pair of capacitive sensor electrodes adjacent the material. The measurement frequency is less than a resonant frequency of the circuit, and the resonant frequency is based on the inductive component and the capacitive component. Information regarding a value of a measured parameter is generated based on applying the oscillating signal at the measurement frequency to the circuit. A value of the measured parameter is related to the thickness of the material.

Abstract: A microelectronic reflector is fabricated by forming a first polysilicon layer on a microelectronic substrate, forming a first phosphosilicate glass (PSG) layer on the first polysilicon layer, and reactive ion etching to remove the first PSG layer from at least a portion of the first polysilicon layer. A second polysilicon layer is formed on at least a portion of the first polysilicon layer from which the first PSG layer was removed and a second PSG layer is formed on at least a second portion of the second polysilicon layer. Reactive ion etching is performed to remove the second PSG layer from at least a portion of the second polysilicon layer. A third PSG layer then is formed on at least a portion of the second polysilicon layer from which the second PSG layer was removed. Reactive ion etching is performed to remove the third PSG layer from at least a portion of the second polysilicon layer.

Abstract: A microelectronic reflector is fabricated by forming a first polysilicon layer on a microelectronic substrate, forming a first phosphosilicate glass (PSG) layer on the first polysilicon layer, and reactive ion etching to remove the first PSG layer from at least a portion of the first polysilicon layer. A second polysilicon layer is formed on at least a portion of the first polysilicon layer from which the first PSG layer was removed and a second PSG layer is formed on at least a second portion of the second polysilicon layer. Reactive ion etching is performed to remove the second PSG layer from at least a portion of the second polysilicon layer. A third PSG layer then is formed on at least a portion of the second polysilicon layer from which the second PSG layer was removed. Reactive ion etching is performed to remove the third PSG layer from at least a portion of the second polysilicon layer.

Abstract: A variable capacitor having low loss and a correspondingly high Q is provided. In addition to a substrate, the variable capacitor includes at least one substrate electrode and a substrate capacitor plate that are disposed upon the substrate and formed of a low electrical resistance material, such as HTS material or a thick metal layer. The variable capacitor also includes a bimorph member extending outwardly from the substrate and over the at least one substrate electrode. The bimorph member includes first and second layers formed of materials having different coefficients of thermal expansion. The first and second layers of the bimorph member define at least one bimorph electrode and a bimorph capacitor plate such that the establishment of a voltage differential between the substrate electrode and the bimorph electrode moves the bimorph member relative to the substrate electrode, thereby altering the interelectrode spacing as well as the distance between the capacitor plates.