Abstract: A system, method and related data structures for discovering and describing computing resources available at various computing devices, and for exposing those resources as services that are addressable by software applications. The data describing the resources is arranged according to an identity-based schema. The computing resources may include, for example, storage capacity, bandwidth, processing power, input methods and mechanism, and rendering methods. The method and system are identity-based, whereby a user (with an identity) has access to the distributed resources commensurate with that identity.

Abstract: Optical inspection methods and apparatus for high-resolution photomasks using only a test image. A filter is applied to an image signal received from radiation that is transmitted by or reflected from a photomask having a test image. The filter may be implemented using programmed control to adjust and control filter conditions, illumination conditions, and magnification conditions.

Abstract: An extreme ultraviolet (EUM) mask inspection system, comprising a light source to project EUV light along an optical axis, an illumination system to receive the EUV light from the source, the illumination system comprising a spectral purity filter (SPF), the SPF transmits a first portion of the EUV light along the optical axis toward a mask and the SPF comprising a plurality of at least partially reflective elements, said elements reflects a second portion of the EUV light off the optical axis, a projection system adapted to receive the first portion of the EUV light after it has illuminated the mask, a first detector array adapted to receive the image, and a second detector array to receive the second portion of the EUV light. The SPF may comprise one or more multilayer interference-type filters. Alternatively, the SPF comprises a thin film filter disposed on a grazing incidence mirror array.

Abstract: Various embodiments related to the generation and provision of media metadata are disclosed. For example, one disclosed embodiment provides a computing device having a logic subsystem configured to execute instructions, and a data holding subsystem comprising instructions stored thereon that are executable by the processor to receive an input of a video and/or audio content item, and to compare the content item to one or more object descriptors each representing an object for locating within the content item to locate instances of one or more of the objects in the content item. The instructions are further executable to generate metadata for each object located in the video content item, and to receive a validating user input related to whether the metadata generated for a selected object is correct.

Abstract: Optical inspection methods and apparatus for high-resolution photomasks using only a test image. A filter is applied to an image signal received from radiation that is transmitted by or reflected from a photomask having a test image. The filter may be implemented using programmed control to adjust and control filter conditions, illumination conditions, and magnification conditions.

Abstract: Various embodiments related to the generation and provision of media metadata are disclosed. For example, one disclosed embodiment provides a computing device having a logic subsystem configured to execute instructions, and a data holding subsystem comprising instructions stored thereon that are executable by the processor to receive an input of a video and/or audio content item, and to compare the content item to one or more object descriptors each representing an object for locating within the content item to locate instances of one or more of the objects in the content item. The instructions are further executable to generate metadata for each object located in the video content item, and to receive a validating user input related to whether the metadata generated for a selected object is correct.

Abstract: An extreme ultraviolet (EUM) mask inspection system, comprising a light source to project EUV light along an optical axis, an illumination system to receive the EUV light from the source, the illumination system comprising a spectral purity filter (SPF), the SPF transmits a first portion of the EUV light along the optical axis toward a mask and the SPF comprising a plurality of at least partially reflective elements, said elements reflects a second portion of the EUV light off the optical axis, a projection system adapted to receive the first portion of the EUV light after it has illuminated the mask, a first detector array adapted to receive the image, and a second detector array to receive the second portion of the EUV light. The SPF may comprise one or more multilayer interference-type filters. Alternatively, the SPF comprises a thin film filter disposed on a grazing incidence mirror array.

Abstract: A method for synchronizing sample stage motion with a time delay integration (TDI) charge-couple device (CCD) in a semiconductor inspection tool, including: measuring a lateral position of a stage holding a sample being inspected; measuring a vertical position of the stage; determining a corrected lateral position of an imaged pixel of the sample based on the measured lateral and vertical positions; and synchronizing charge transfer of the TDI CCD with the corrected lateral position of the imaged pixel.

Abstract: Various embodiments related to the generation and provision of media metadata are disclosed. For example, one disclosed embodiment provides a computing device having a logic subsystem configured to execute instructions, and a data holding subsystem comprising instructions stored thereon that are executable by the processor to receive an input of a video and/or audio content item, and to compare the content item to one or more object descriptors each representing an object for locating within the content item to locate instances of one or more of the objects in the content item. The instructions are further executable to generate metadata for each object located in the video content item, and to receive a validating user input related to whether the metadata generated for a selected object is correct.

Abstract: A method for synchronizing sample stage motion with a time delay integration (TDI) charge-couple device (CCD) in a semiconductor inspection tool, including: measuring a lateral position of a stage holding a sample being inspected; measuring a vertical position of the stage; determining a corrected lateral position of an imaged pixel of the sample based on the measured lateral and vertical positions; and synchronizing charge transfer of the TDI CCD with the corrected lateral position of the imaged pixel.

Abstract: Various embodiments related to the generation and provision of media metadata are disclosed. For example, one disclosed embodiment provides a computing device having a logic subsystem configured to execute instructions, and a data holding subsystem comprising instructions stored thereon that are executable by the processor to receive an input of a video and/or audio content item, and to compare the content item to one or more object descriptors each representing an object for locating within the content item to locate instances of one or more of the objects in the content item. The instructions are further executable to generate metadata for each object located in the video content item, and to receive a validating user input related to whether the metadata generated for a selected object is correct.

Abstract: A networking service that receives information about behaviors of the users, such as behaviors in which a user is engaging now or will engage in the future. The networking service compares the behavior information to identify matches between two or more users. When a match is detected, the networking service may form a network (e.g., a social network) between the two or more users by connecting the users in a network. The users may then communicate in the network, and additional users may be added to the network when those users are determined to be engaging in the behavior. When the networking service detects that the users are no longer engaging in the behaviors on which the match was identified, the networking service may disconnect users from one another or the network, and the networking service may eliminate the network.

Abstract: Methods and apparatus relating to electromagnetic beam (e.g., laser beam) conditioning are described. In an embodiment, electromagnetic beam conditioning may be performed utilizing reflectors to temporally differentiate electromagnetic beam subsections and sub-beams resulting in reduced spatial coherence of the beam. Other embodiments are also described.

Abstract: Methods for detecting and classifying defects on a reticle are provided. One method includes acquiring images of the reticle at first and second conditions during inspection of the reticle. The first condition is different than the second condition. The method also includes detecting the defects on the reticle using one or more of the images acquired at the first condition. In addition, the method includes classifying an importance of the defects detected on the reticle using one or more of the images acquired at the second condition. The detecting and classifying steps are performed substantially simultaneously during the inspection.

Abstract: Methods for detecting and classifying defects on a reticle are provided. One method includes acquiring images of the reticle at first and second conditions during inspection of the reticle. The first condition is different than the second condition. The method also includes detecting the defects on the reticle using one or more of the images acquired at the first condition. In addition, the method includes classifying an importance of the defects detected on the reticle using one or more of the images acquired at the second condition. The detecting and classifying steps are performed substantially simultaneously during the inspection.

Abstract: Methods and systems for inspecting a reticle are provided. In an embodiment, a system may include an inspection subsystem configured to form a first aerial image of the reticle. The first aerial image may be used to detect defects on the reticle. The system may also include a review subsystem coupled to the inspection subsystem. For example, the inspection and review subsystems may have common optics, separate optics and a common stage, or separate stages and a common handler. The review subsystem may be configured to form a second aerial image of the reticle. The second aerial image may be used to analyze the defects. In another embodiment, the system may include an image computer configured to receive image data from the inspection and review subsystems representing the first and second aerial images. The image computer may also be configured to perform one or more functions on the image data.

Abstract: Methods and systems for inspecting a reticle are provided. In an embodiment, a method may include forming an aerial image of the reticle using a set of exposure conditions. The reticle may include optical proximity correction (OPC) features. The method may also include detecting defects on the reticle by comparing the aerial image to a reference image stored in a database. The reference image may be substantially optically equivalent to an image of the reticle that would be printed on a specimen by an exposure system under the set of exposure conditions. The reference image may not include images of the OPC features. Therefore, a substantial portion of the defects include defects that would be printed onto the specimen by the exposure system using the reticle under the set of exposure conditions. The method may also include indicating the defects that are detected in critical regions of the reticle.

Abstract: Methods and systems for inspecting a reticle are provided. A method may include forming an aerial image of the reticle with an inspection system at a wavelength different from a wavelength of an exposure system. The method may also include correcting the aerial image for differences between modulation transfer functions (MTF) of the inspection system and the exposure system. In this manner, the corrected aerial image may be substantially equivalent to an image of the reticle that would be printed onto a specimen by the exposure system at the wavelength of the exposure system. In addition, the method may include detecting defects on the reticle using the corrected aerial image. The detected defects may include approximately all of the defects that would be printed onto a specimen by the exposure system using the reticle.

Abstract: A system, method and related data structures for discovering and describing computing resources available at various computing devices, and for exposing those resources as services that are addressable by software applications. The data describing the resources is arranged according to an identity-based schema. The computing resources may include, for example, storage capacity, bandwidth, processing power, input methods and mechanism, and rendering methods. The method and system are identity-based, whereby a user (with an identity) has access to the distributed resources commensurate with that identity.