Abstract: Disclosed herein are example methods, systems, and devices for compressed sensing analog to digital conversion. In an example embodiment, a multiplication circuit is configured to multiply an input signal with a measurement signal to produce a multiplied signal, where the measurement signal includes data from a column of a measurement matrix. The measurement matrix may be generated by a linear feedback shift register (LFSR)-based measurement-matrix generator. An integration circuit may be coupled to the multiplication circuit and configured to integrate the multiplied signal for a predefined amount of time to produce an integrated signal. An analog to digital converter (ADC) circuit may be coupled to the integration circuit and configured to (i) sample the integrated signal and (ii) produce an output signal comprising at least one sample of the integrated signal.

Abstract: Disclosed herein is an improved power amplifier, referred to as a Switched-Capacitor Radio Frequency Power Amplification (SCPA). The SCPA may be fabricated with scale CMOS technology. The SCPA may include a plurality of stages, each stage including a storage device, a switch, and selection circuitry. Various combinations of the stages may produce an output signal based on characteristics of a reference signal to be amplified. The output from the stages may be combined to create an amplified approximate square wave. The amplified square wave may be filtered by output circuitry such as a bandpass matching circuit, resulting in an output signal that may be an amplified version of the reference signal.

Abstract: Disclosed herein are example methods, systems, and devices for compressed sensing analog to digital conversion. In an example embodiment, a multiplication circuit is configured to multiply an input signal with a measurement signal to produce a multiplied signal, where the measurement signal includes data from a column of a measurement matrix. The measurement matrix may be generated by a linear feedback shift register (LFSR)-based measurement-matrix generator. An integration circuit may be coupled to the multiplication circuit and configured to integrate the multiplied signal for a predefined amount of time to produce an integrated signal. An analog to digital converter (ADC) circuit may be coupled to the integration circuit and configured to (i) sample the integrated signal and (ii) produce an output signal comprising at least one sample of the integrated signal.

Abstract: Embodiments of the present invention include a common-gate amplifier having an input terminal and an output terminal, a transistor having a source, a drain, and a gate, four inductors, and two capacitors, and a negative amplification circuitry. The negative amplification circuitry has an input terminal to receive an RF signal. The negative amplification circuitry applies negative or zero amplification to the RF signal and outputs the negative or zero amplified signal on an output terminal. Alternative embodiments include a Colpitts differential oscillator, which includes two Colpitts single-ended oscillators. Each Colpitts single-ended oscillator includes a transistor. The source of the transistor in one Colpitts single-ended oscillator may be capacitively coupled to the gate of the transistor in the other Colpitts single-ended oscillator.