Abstract: A method, system, and computer program product for determining a core-to-ferrule offset of a ferrule for a fiber optic connector. A reference ferrule is physically aligned with a core imager by positioning the reference ferrule so that edges of the reference ferrule in a plurality of profile images are aligned with fiducial markers in the images. The reference ferrule is incrementally rotated about its longitudinal center access, a core image captured at each rotational angle, and a reference core-to-ferrule offset determined based on the core images. A test ferrule is physically aligned with the core imager by positioning the test ferrule so that edges of the test ferule are aligned with the edges of the reference ferrule in a plurality of profile images. The core-to-ferrule offset of the test ferrule is then determined based on an offset between the test and reference cores in a composite core image.

Abstract: A method, system, and computer program product for determining a core-to-ferrule offset of a ferrule for a fiber optic connector. A reference ferrule is physically aligned with a core imager by positioning the reference ferrule so that edges of the reference ferrule in a plurality of profile images are aligned with fiducial markers in the images. The reference ferrule is incrementally rotated about its longitudinal center access, a core image captured at each rotational angle, and a reference core-to-ferrule offset determined based on the core images. A test ferrule is physically aligned with the core imager by positioning the test ferrule so that edges of the test ferule are aligned with the edges of the reference ferrule in a plurality of profile images. The core-to-ferrule offset of the test ferrule is then determined based on an offset between the test and reference cores in a composite core image.

Abstract: The present invention relates to a laser cutting technology for cutting and separating thin substrates of transparent materials, for example to cutting of display glass compositions mainly used for production of Thin Film Transistors (TFT) devices. The described laser process can be used to make straight cuts, for example at a speed of >0.25 m/sec, to cut sharp radii outer corners (<1 mm), and to create arbitrary curved shapes including forming interior holes and slots. A method of laser processing an alkaline earth boro-aluminosilicate glass composite workpiece includes focusing a pulsed laser beam into a focal line. The pulsed laser produces pulse bursts with 5-20 pulses per pulse burst and pulse burst energy of 300-600 micro Joules per burst. The focal line is directed into the glass composite workpiece, generating induced absorption within the material.

Abstract: A substrate with coated edge surfaces, an apparatus for performing the coating, and a method therefor are described. The substrate may include edge surface electrical connectors, wherein the edge coating is coated overtop the edge surface electrical connectors. The apparatus for performing the coating operation includes a rotary fixture configured to facilitate coating of all edge surfaces of a stack of substrate prior to curing of the edge surface coating, wherein according to the method, edge surfaces of one group of corresponding edge surfaces in the stack are coated with a coating material, the rotary fixture is then rotated to position a second group of edge surfaces for coating, and so forth. The coating process is controlled to obtain a consistent overflow onto major surfaces of the stacked substrates.

Abstract: A method and system for measuring signal loss in a fiber optic cable. The tail ends of reference and test fiber optic cables are illuminated with a diffuse light. The head end of each of the reference and test fiber optic cables are positioned in a measurement area. A core imager captures an image of the core of each head-end while it is in the measurement area. Reference and test radiant fluxes emitted from the reference and test head-ends are determined from the respective core images. The relative signal loss of the test fiber optic cable is then determined by comparing the test radiant flux to the reference radiant flux.

Abstract: An electronic apparatus includes a substrate including a first major surface, a second major surface, and an edge surface. The edge surface includes a radius of curvature extending between the first major surface and the second major surface. The electronic apparatus includes an opto-electronic device positioned on the first major surface. The electronic apparatus includes an electrical component positioned on the second major surface. The electronic apparatus includes a first electrically-conductive trace attached to the edge surface. The first electrically-conductive trace electrically connects a first portion of the opto-electronic device to the electrical component and defines a first current path. The electronic apparatus includes a second electrically-conductive trace extending through an opening in the substrate.

Abstract: Disclosed herein are glass articles coated on at least one surface with an electrochromic layer and comprising minimal regions of laser damage, and methods for laser processing such glass articles. Insulated glass units comprising such coated glass articles are also disclosed herein.

Abstract: A method, system, and computer program product for determining a core-to-ferrule offset of a ferrule for a fiber optic connector. A reference ferrule is physically aligned with a core imager by positioning the reference ferrule so that edges of the reference ferrule in a plurality of profile images are aligned with fiducial markers in the images. The reference ferrule is incrementally rotated about its longitudinal center access, a core image captured at each rotational angle, and a reference core-to-ferrule offset determined based on the core images. A test ferrule is physically aligned with the core imager by positioning the test ferrule so that edges of the test ferule are aligned with the edges of the reference ferrule in a plurality of profile images. The core-to-ferrule offset of the test ferrule is then determined based on an offset between the test and reference cores in a composite core image.

Abstract: Processes of chamfering and/or beveling an edge of a glass substrate of arbitrary shape using lasers are described herein. Two general methods to produce chamfers on glass substrates are the first method involves cutting the edge with the desired chamfer shape utilizing an ultra-short pulse laser to create perforations within the glass; followed by an ion exchange.

Abstract: The present invention relates to a laser cutting technology for cutting and separating thin substrates of transparent materials, for example to cutting of display glass compositions mainly used for production of Thin Film Transistors (TFT) devices. The described laser process can be used to make straight cuts, for example at a speed of >0.25 m/sec, to cut sharp radii outer corners (<1 mm), and to create arbitrary curved shapes including forming interior holes and slots. A method of laser processing an alkaline earth boro-aluminosilicate glass composite workpiece includes focusing a pulsed laser beam into a focal line. The pulsed laser produces pulse bursts with 5-20 pulses per pulse burst and pulse burst energy of 300-600 micro Joules per burst. The focal line is directed into the glass composite workpiece, generating induced absorption within the material.

Abstract: Optical reader systems and methods with accurate microplate position detection capability are disclosed. The optical reader systems having scanning optical systems that are configured to scan select position-detecting features on the microplate to accurately determine their respective positions. The measurement of the positions of the position-detecting features can also be used to calibrate the optical reader system to reduce or eliminate adverse positioning effects from system non-linearities that arise from one or more of the system components, including the scanning optical system.

Abstract: Disclosed herein are glass articles coated on at least one surface with an electrochromic layer and comprising minimal regions of laser damage, and methods for laser processing such glass articles. Insulated glass units comprising such coated glass articles are also disclosed herein.

Abstract: Processes of chamfering and/or beveling an edge of a glass substrate of arbitrary shape using lasers are described herein. Two general methods to produce chamfers on glass substrates are the first method involves cutting the edge with the desired chamfer shape utilizing an ultra-short pulse laser to create perforations within the glass; followed by an ion exchange.

Abstract: A wavelength-tunable detector for use in a label-independent optical reader for reading at least one resonant waveguide grating (RWG) biosensor is disclosed. The wavelength-tunable detector includes a tunable wavelength filter. Broadband light is made incident upon the RWG biosensor to produce resonantly reflected light, which is then passed through the tunable wavelength filter whose central wavelength is adjusted, such as by varying the filter angle of the tunable wavelength filter. This generates filtered resonantly reflected light, which is detected by a photodetector that generates an electrical signal in response thereto. The electrical signal is representative of the detected spectrum, which includes the center resonant wavelength of the RWG biosensor. A controller can be used to determine the center resonant wavelength from the electrical signal.

Abstract: A wavelength-tunable detector for use in a label-independent optical reader for reading at least one resonant waveguide grating (RWG) biosensor is disclosed. The wavelength-tunable detector includes a tunable wavelength filter. Broadband light is made incident upon the RWG biosensor to produce resonantly reflected light, which is then passed through the tunable wavelength filter whose central wavelength is adjusted, such as by varying the filter angle of the tunable wavelength filter. This generates filtered resonantly reflected light, which is detected by a photodetector that generates an electrical signal in response thereto. The electrical signal is representative of the detected spectrum, which includes the center resonant wavelength of the RWG biosensor. A controller can be used to determine the center resonant wavelength from the electrical signal.

Abstract: A multi-grating resonant waveguide (RWG) biosensor for an optical reader system having a spatial resolution limit is disclosed. The multi-grating RWG biosensor includes one or more signal-grating regions and one or more reference-grating regions. The multi-grating RWG biosensor can also include a non-resonance region that spatially separates the one or more signal-grating regions, that spatially separates the one or more reference-grating regions, and that spatially separates the one or more reference-grating regions from the one or more signal-grating regions. The non-resonance region can have a minimum width greater than the optical reader system spatial resolution limit. The RWG biosensor can have an asymmetric split-grating configuration. Methods of measuring a signal resonant wavelength of a multi-grating RWG biosensor using an optical reader having a spatial resolution limit are also disclosed.

Abstract: The invention is a microplate mounting system for mounting a microplate relative to an optical reader to control an angle of incidence of an interrogation beam at the microplate and includes a reference plane with at least one set of mount features that engage one or both of the bottom of the microplate and the skirt of the and a first positioning mechanism that provides a reversible and predetermined separation in the z direction between a plane formed by the bottom of the microplate and the reader, to control the angle of incidence of the interrogation beam at the microplate by reversibly controlling the relative positioning of the microplate in the z direction through the engagement between the bottom and/or skirt of the microplate and the at least one set of mount features.

Abstract: Optical reader systems and methods with accurate microplate position detection capability are disclosed. The optical reader systems having scanning optical systems that are configured to scan select position-detecting features on the microplate to accurately determine their respective positions. The measurement of the positions of the position-detecting features can also be used to calibrate the optical reader system to reduce or eliminate adverse positioning effects from system non-linearities that arise from one or more of the system components, including the scanning optical system.

Abstract: The invention is a microplate mounting system for mounting a microplate relative to an optical reader to control an angle of incidence of an interrogation beam at the microplate and includes a reference plane with at least one set of mount features that engage one or both of the bottom of the microplate and the skirt of the and a first positioning mechanism that provides a reversible and predetermined separation in the z direction between a plane formed by the bottom of the microplate and the reader, to control the angle of incidence of the interrogation beam at the microplate by reversibly controlling the relative positioning of the microplate in the z direction through the engagement between the bottom and/or skirt of the microplate and the at least one set of mount features.

Abstract: A multi-wavelength reference microplate for a label-independent optical reader is disclosed. The microplate includes a support plate that supports a plurality of reference wells. At least one of the reference wells is configured as a multi-wavelength reference well having disposed therein two or more resonant waveguide grating sections that respectively reflect two or more different reference resonant wavelengths within the light source wavelength band. Methods for making and using the microplates are also disclosed.