Patents by Inventor David Andrew Risk

David Andrew Risk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Gas emission detection device, system and method
    Patent number: 10203311
    Abstract: An emission monitoring system includes at least one gas analyzer for measuring a concentration of a first gas and a concentration of a second gas, a positioning system for determining the location of the at least one gas analyzer when the concentration of the first gas is measured. A method for monitoring emissions at an industrial site and a computer-implemented event detection system applies the steps of detecting the presence of a gas emission event based on a first detection ratio calculated from the measured concentration of the first gas, the measured concentration of the second gas, a background concentration of the first gas and a background concentration of the second gas.
    Type: Grant
    Filed: December 1, 2015
    Date of Patent: February 12, 2019
    Assignee: St. Francis Xavier University
    Inventors: David Andrew Risk, Bjorn-Gustaf James Brooks, Martin Lavoie
  • GAS EMISSION DETECTION DEVICE, SYSTEM AND METHOD
    Publication number: 20160161456
    Abstract: An emission monitoring system includes at least one gas analyzer for measuring a concentration of a first gas and a concentration of a second gas, a positioning system for determining the location of the at least one gas analyzer when the concentration of the first gas is measured. A method for monitoring emissions at an industrial site and a computer-implemented event detection system applies the steps of detecting the presence of a gas emission event based on a first detection ratio calculated from the measured concentration of the first gas, the measured concentration of the second gas, a background concentration of the first gas and a background concentration of the second gas.
    Type: Application
    Filed: December 1, 2015
    Publication date: June 9, 2016
    Inventors: David Andrew Risk, Bjorn-Gustaf James Brooks, Martin Lavoie
  • System and method for determining flux of isotopologues
    Patent number: 8681336
    Abstract: A method and system comprising measuring concentrations of first and second isotopologues of a gas of interest within a first cavity that is sealably in contact with a soil location through an inlet membrane, and the first cavity being defined by chamber walls having openings covered by outlet membranes. Reference concentrations of the first and second isotopologues are measured in a second cavity having a closed bottom, the second cavity being defined by chamber walls having openings covered by more outlet membranes. Relative flux of the isotopologues can be calculated using the measured concentrations.
    Type: Grant
    Filed: March 12, 2012
    Date of Patent: March 25, 2014
    Assignee: St. Francis Xavier University
    Inventors: Nicholas R. Nickerson, Jocelyn Elizabeth Egan, David Andrew Risk
  • SYSTEM AND METHOD FOR DETERMINING FLUX OF ISOTOPOLOGUES
    Publication number: 20130235378
    Abstract: A method and system comprising measuring concentrations of first and second isotopologues of a gas of interest within a first cavity that is sealably in contact with a soil location through an inlet membrane, and the first cavity being defined by chamber walls having openings covered by outlet membranes. Reference concentrations of the first and second isotopologues are measured in a second cavity having a closed bottom, the second cavity being defined by chamber walls having openings covered by more outlet membranes. Relative flux of the isotopologues can be calculated using the measured concentrations.
    Type: Application
    Filed: March 12, 2012
    Publication date: September 12, 2013
    Applicant: St. Francis Xavier University
    Inventors: Nicholas R. Nickerson, Jocelyn Elizabeth Egan, David Andrew Risk