Patents by Inventor David Aue

David Aue has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
    Publication number: 20230251284
    Abstract: An atomic force microscope is provided having a controller configured to store one or more positional parameters output by a sensor assembly when a light spot is located at a first preset position on the surface of the cantilever. The controller is further configured to operate an actuator assembly so as to induce movement of the spot away from the first preset position, to detect said movement of the first spot based on a change in the one or more positional parameters output by the sensor assembly, and to operate an optical assembly in response to the detected movement of the first spot to return the first spot to the first preset position.
    Type: Application
    Filed: March 21, 2023
    Publication date: August 10, 2023
    Inventors: Jason Bemis, David Aue, Aleksander Labuda
  • Automated optimization of AFM light source positioning
    Patent number: 11644478
    Abstract: An atomic force microscope is provided having a controller configured to store one or more positional parameters output by a sensor assembly when a light spot is located at a first preset position on the surface of the cantilever. The controller is further configured to operate an actuator assembly so as to induce movement of the spot away from the first preset position, to detect said movement of the first spot based on a change in the one or more positional parameters output by the sensor assembly, and to operate an optical assembly in response to the detected movement of the first spot to return the first spot to the first preset position.
    Type: Grant
    Filed: February 2, 2022
    Date of Patent: May 9, 2023
    Assignee: Oxford Instruments Asylum Research, Inc.
    Inventors: Jason Bemis, David Aue, Aleksander Labuda
  • AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
    Publication number: 20220244289
    Abstract: An atomic force microscope is provided having a controller configured to store one or more positional parameters output by a sensor assembly when a light spot is located at a first preset position on the surface of the cantilever. The controller is further configured to operate an actuator assembly so as to induce movement of the spot away from the first preset position, to detect said movement of the first spot based on a change in the one or more positional parameters output by the sensor assembly, and to operate an optical assembly in response to the detected movement of the first spot to return the first spot to the first preset position.
    Type: Application
    Filed: February 2, 2022
    Publication date: August 4, 2022
    Inventors: Jason Bemis, David Aue, Aleksander Labuda