Abstract: Compact powered devices are provided. The powered devices include a substrate, a battery, an activation element and an output device in electrical or optical communication. The compact powered device can be a card that, when subjected to an outside influence or stimulus, displays a message or illumination. The illumination can be circumscribed within a graphical design of the card. The card can be a gift card, a loyalty card, a novelty card, a financial card, an identification card or a smart card. The output device can be a light guide film that distributes light from an illumination device such as an LED which, when activated, illuminates a side of the light guide film. The output device is configured to display a number, a graphic, a logo, or another pattern or message in response to the stimulus.

Abstract: A semiconductor fabrication system, method and medium are disclosed. The system includes a semiconductor fabrication tool and a software application, in communication with the semiconductor fabrication tool. The semiconductor fabrication tool includes a chamber configured to perform at least one process on a semiconductor wafer. The software application is configured to determine specified qualities of the first chamber in performing the at least one process. The specified qualities are directed to at least one of: a processing time required to perform the at least one process, a rate of producing defective output products of the at least one process, a uniformity of output products of the at least one process, and a capability index of the at least one process.

Abstract: A semiconductor fabrication system, method and medium are disclosed. The system includes a semiconductor fabrication tool and a software application, in communication with the semiconductor fabrication tool. The semiconductor fabrication tool includes a chamber configured to perform at least one process on a semiconductor wafer. The software application is configured to determine specified qualities of the first chamber in performing the at least one process. The specified qualities are directed to at least one of: a processing time required to perform the at least one process, a rate of producing defective output products of the at least one process, a uniformity of output products of the at least one process, and a capability index of the at least one process.