Abstract: Systems and methods are described herein for selectively loading code elements included in a plurality of software entities comprising a target software entity and one or more reference software entities to facilitate analysis of the target software entity by a code analysis tool, such as a static code analysis tool. In one embodiment, all of the code elements in the target software entity are loaded while only those code elements included in the reference software entities that are determined to be most important from a dependency standpoint are loaded. The loaded code elements may be used to obtain suitable definitions of the code elements included in the target software entity for the purpose of code analysis.

Abstract: Systems and methods are described herein for selectively loading code elements included in a plurality of software entities comprising a target software entity and one or more reference software entities to facilitate analysis of the target software entity by a code analysis tool, such as a static code analysis tool. In one embodiment, all of the code elements in the target software entity are loaded while only those code elements included in the reference software entities that are determined to be most important from a dependency standpoint are loaded. The loaded code elements may be used to obtain suitable definitions of the code elements included in the target software entity for the purpose of code analysis.

Abstract: Methods, systems, and computer-readable media are disclosed to perform path-sensitive dataflow analysis including path refinement. A path-insensitive dataflow analysis may be performed on a control flow graph (CFG) of a computer program to detect a set of potential defects in the computer program. A path-sensitive dataflow analysis may be performed to identify one or more infeasible paths of the CFG without modifying the CFG. Potential defects associated with the one or more infeasible paths may be removed from the set of potential defects to produce a resulting reduced set of potential defects. The resulting reduced set of potential defects may be output.