Patents by Inventor David Bennan

David Bennan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Target alignment for x-ray scattering measurements
    Publication number: 20070286344
    Abstract: A method for X-ray analysis of a sample includes directing a beam of X-rays to impinge on a structure in the sample such that the X-rays are scattered from the structure in a pattern of stripes, and receiving the scattered X-rays using an array of detectors. A relative alignment between the sample and the array is adjusted so that the stripes are parallel to the detectors.
    Type: Application
    Filed: August 17, 2007
    Publication date: December 13, 2007
    Inventors: Boris Yokhin, Alexander Krokhmal, Asher Peled, David Bennan