Patents by Inventor David Bouyge

David Bouyge has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8520203
    Abstract: A method and device is provided for characterizing microscopic elements. A source signal may be chopped by means of microsystems of opto-electromechanical elements (MOEMS), which gives rise to temporal modulation of the excitation signals. The method of characterizing microscopic elements involves propagating a dispersed light source signal, spatially chopping the spectrum of the source signal into at least two excitation signals having predetermined wavelengths ?i, coding the excitation signals, focusing the excitation signals in order to generate a sensor signal propagated towards a measurement zone, and analyzing an interaction signal issuing from the interaction of the sensor signal with the microscopic elements situated in the measuring space. The spatial chopping of the spectrum of the source light signal is performed by a microsystem of opto-electromechanical elements (MOEMS).
    Type: Grant
    Filed: October 10, 2008
    Date of Patent: August 27, 2013
    Assignees: C.N.R.S. Centre National de la Recherche Scientifique, University de Limoges
    Inventors: Vincent Couderc, Philippe LeProux, Laurent LeFort, David Bouyge, Christelle Lesvigne-Buy, Aurelian Crunteanu Stanescu
  • Publication number: 20120038916
    Abstract: A method and device is provided for characterizing microscopic elements. A source signal may be chopped by means of microsystems of opto-electromechanical elements (MOEMS), which gives rise to temporal modulation of the excitation signals. The method of characterizing microscopic elements involves propagating a dispersed light source signal, spatially chopping the spectrum of the source signal into at least two excitation signals having predetermined wavelengths ?i, coding the excitation signals, focusing the excitation signals in order to generate a sensor signal propagated towards a measurement zone, and analyzing an interaction signal issuing from the interaction of the sensor signal with the microscopic elements situated in the measuring space. The spatial chopping of the spectrum of the source light signal is performed by a microsystem of opto-electromechanical elements (MOEMS).
    Type: Application
    Filed: April 1, 2011
    Publication date: February 16, 2012
    Applicants: C.N.R.S. Centre National de la Recherche Scientifique, Universite de Limoges
    Inventors: Vincent Couderc, Philippe LeProux, Laurent LeFort, David Bouyge, Christelle Lesvigne-Buy, Aurelian Crunteanu Stanescu
  • Publication number: 20110199609
    Abstract: A method and device is provided for characterizing microscopic elements. A source signal may be chopped by means of microsystems of opto-electromechanical elements (MOEMS), which gives rise to temporal modulation of the excitation signals. The method of characterizing microscopic elements involves propagating a dispersed light source signal, spatially chopping the spectrum of the source signal into at least two excitation signals having predetermined wavelengths ?i, coding the excitation signals, focusing the excitation signals in order to generate a sensor signal propagated towards a measurement zone, and analyzing an interaction signal issuing from the interaction of the sensor signal with the microscopic elements situated in the measuring space. The spatial chopping of the spectrum of the source light signal is performed by a microsystem of opto-electromechanical elements (MOEMS).
    Type: Application
    Filed: October 10, 2008
    Publication date: August 18, 2011
    Applicant: UNIVERSITE DE LIMOGES
    Inventors: Vincent Couderc, Philippe LeProux, Laurent LeFort, David Bouyge, Christelle Lesvigne-Buy, Aurelian Crunteanu Stanescu