Abstract: A method of adjusting values for sensitivities of X-ray detectors comprised in a CT-imager that generate signals responsive to X-rays from an X-ray source in the imager, comprising: acquiring signals generated by X-ray detectors in the CT-imager responsive to X-rays incident thereon from the X-ray source for views taken during a scanning procedure performed by the CT-imager to image a patient when only air is present in a space between the X-ray source and the detectors; and using the signals to adjust the values of the sensitivities.

Abstract: A perpendicular magnetic recording disk has a granular cobalt alloy recording layer (RL) containing on the “soft” magnetic underlayer (SUL). The SUL is doped with judiciously chosen elements or alloys or is capped or intercalated with said elements or metal alloy layers. The resulting disk and the SUL in particular has good recording properties, improved mechanical strength and improved corrosion resistance over a comparable disk without the doping or thin layers.

Abstract: A method is presented for measuring the height of an air-bearing separating a flying component from a rotating surface using physical deformation of a small amount of material deposited on the surface. One embodiment of the invention is a method of measuring the fly-height of a slider using physical deformation of material deposited on the disk. Small amounts of the deformable material such as a viscoelastic lubricant are placed on a limited area of the disk so that the slider can otherwise fly normally. The slider's fly-height is established over the unaltered portion of the disk, then the slider impacts the deformable material. This process results in the deformable material being flattened or removed above the fly-height of the slider. The height of the remaining material is then measurable as the fly-height.

Abstract: A method is presented for measuring the height of an air-bearing separating a flying component from a rotating surface using physical deformation of a small amount of material deposited on the surface. One embodiment of the invention is a method of measuring the fly-height of a slider using physical deformation of material deposited on the disk. Small amounts of the deformable material such as a viscoelastic lubricant are placed on a limited area of the disk so that the slider can otherwise fly normally. The slider's fly-height is established over the unaltered portion of the disk, then the slider impacts the deformable material. This process results in the deformable material being flattened or removed above the fly-height of the slider. The height of the remaining material is then measurable as the fly-height.

Abstract: A method of adjusting values for sensitivities of X-ray detectors comprised in a CT-imager that generate signals responsive to X-rays from an X-ray source in the imager, comprising: acquiring signals generated by X-ray detectors in the CT-imager responsive to X-rays incident thereon from the X-ray source for views taken during a scanning procedure performed by the CT-imager to image a patient when only air is present in a space between the X-ray source and the detectors; and using the signals to adjust the values of the sensitivities.

Abstract: Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.

Abstract: Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.

Abstract: Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.