Patents by Inventor David C. Hoyal

David C. Hoyal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230408716
    Abstract: Methods for modeling subsurface formations may include: analyzing at least one strata within a stratigraphic structure of a formation to ascertain one or more physical properties for the at least one strata; correlating the one or more physical properties for the at least one strata to one or more formative hydraulic and sediment transport parameters for the at least one strata based on a correlation; modeling deposition of particulate matter during formation of the stratigraphic structure using a model constrained by the one or more formative hydraulic and sediment transport parameters to yield a three-dimensional model of the stratigraphic structure of the formation; and conditioning the three-dimensional model using the one or more physical properties for the at least one strata.
    Type: Application
    Filed: May 2, 2023
    Publication date: December 21, 2023
    Inventors: David C. HOYAL, Juan J. FEDELE, Timothy DEMKO, Mrugesh S. SHRINGARPURE, Nathan A. LENTSCH, Kathryn C. DENOMMEE, Nicole J. BAYLISS
  • Publication number: 20230375744
    Abstract: The methods for constraining subsurface models may include: analyzing at least one strata within a stratigraphic structure of a formation to ascertain one or more physical properties for the at least one strata; correlating the one or more physical properties for the at least one strata to one or more formative hydraulic and sediment transport parameters for the at least one strata based on a correlation; and modeling the formation with a subsurface model constrained by the one or more formative hydraulic and sediment transport parameters for the at least one strata.
    Type: Application
    Filed: April 17, 2023
    Publication date: November 23, 2023
    Inventors: David C. HOYAL, Juan J. FEDELE, Kathryn C. DENOMMEE, Mrugesh S. SHRINGARPURE, Nathan A. LENTSCH, Nicole J. BAYLISS, Timothy DEMKO
  • Publication number: 20230375733
    Abstract: Methods for assessing lithology characteristics of bedforms within or relating to a subterranean formation using seismic data may include: assigning a bedform type to a bedform; extracting a cross-section of seismic data along the bedform in-line +/?15° with a fluid flow direction associated with the bedform; analyzing the cross-section to ascertain a structural characteristic of the bedform, wherein the structural characteristic comprises one or more of: a wavelength, a wave height, a bedform slope, a bedform asymmetry, a bedform migration, and a planform crest shape; and estimating a lithology for the bedform based on a correlation between (a) the lithology and (b) the bedform type and the structural characteristic.
    Type: Application
    Filed: April 26, 2023
    Publication date: November 23, 2023
    Inventors: Juan J. FEDELE, David C. HOYAL
  • Patent number: 8117019
    Abstract: A method is disclosed for simulating the formation of sedimentary deposits. In one embodiment, this method involves, (a) solving a two-dimensional time-dependent map view system of equations for at least flow momentum, flow height, suspended sediment concentration, and entrainment of overlying water, (b) calculating net sediment deposition at each map view location using the flow properties, (c) recording the time-variability of the net sediment deposition.
    Type: Grant
    Filed: August 23, 2005
    Date of Patent: February 14, 2012
    Assignee: ExxonMobil Upstream Research Company
    Inventors: Tao Sun, Dachang Li, Max Deffenbaugh, Chun Huh, David C Hoyal, Neal Adair, Xiao-Hui Wu, Timothy A. Chartrand, John C Van Wagoner
  • Patent number: 7925481
    Abstract: A method is disclosed for using a three-dimensional seismic image of a subsurface earth volume to construct a geologic model specifying the spatially-varying grain size distribution, porosity, and permeability throughout the volume. The method applies to earth volumes composed of water-lain clastic sedimentary deposits and involves, in one embodiment, (a) identifying the outline forms of geologic bodies in geologic data; (b) using the outline forms of the geologic bodies to determine the spatially-varying grain size distribution within the bodies, guided by assumptions about the nature and behavior of the paleoflow that deposited the bodies; (c) determining rock properties such as, porosity and permeability within the geologic bodies based on grain-size distribution, mineralogy and burial history information.
    Type: Grant
    Filed: August 19, 2005
    Date of Patent: April 12, 2011
    Inventors: John C. Van Wagoner, Paul A. Dunn, Max Deffenbaugh, David N. Awwiller, Tao Sun, Dachang Li, David C. Hoyal, Chris J. Donofrio
  • Publication number: 20090204377
    Abstract: A method is disclosed for using a three-dimensional seismic image of a subsurface earth volume to construct a geologic model specifying the spatially-varying grain size distribution, porosity, and permeability throughout the volume. The method applies to earth volumes composed of water-lain clastic sedimentary deposits and involves, in one embodiment, (a) identifying the outline forms of geologic bodies in geologic data; (b) using the outline forms of the geologic bodies to determine the spatially-varying grain size distribution within the bodies, guided by assumptions about the nature and behavior of the paleoflow that deposited the bodies; (c) determining rock properties such as, porosity and permeability within the geologic bodies based on grain-size distribution, mineralogy and burial history information.
    Type: Application
    Filed: August 19, 2005
    Publication date: August 13, 2009
    Inventors: John C. Van Wagoner, Paul A. Dunn, Max Deffenbaugh, David N. Awwiller, Tao Sun, Dachang Li, David C. Hoyal, Chris J. Donofrio
  • Patent number: 7433785
    Abstract: The present invention is a method for predicting the grain size distribution at a designated location within a water-lain sedimentary deposit. Initially, the vertical thickness of the sedimentary deposit at the designated location must be determined, as well as the vertical thickness and grain size distribution at a second location different from the designated location. Second, a distance parameter corresponding to the two locations must be determined. Finally the distance parameter is used, along with the initially determined vertical thickness at both locations and the grain size distribution at the second location to calculate the grain size distribution at the designated location.
    Type: Grant
    Filed: February 20, 2004
    Date of Patent: October 7, 2008
    Assignee: Exxon Mobil Upstream Research Company
    Inventors: Max Deffenbaugh, William B. Heard, Chun Huh, Tao Sun, David C. Hoyal
  • Patent number: 7433784
    Abstract: The properties of a water-lain sediment body are determined from a measurement of grain size distribution and deposit thickness at one location in the body is disclosed. The flow properties at the measured location are determined, the flow properties are extrapolated back to the inlet through which the depositing flow was emitted, at least one property of the water-lain sediment throughout the sediment body is determined by modeling the flow properties using the extrapolated flow properties at the inlet as a boundary condition. The flow properties associated with the sediment body include flow velocity, suspended sediment volume fractions, deposition time, and flow height. The properties of the water-lain sediments include, in addition to the flow properties associated with deposition of the sediments, the thickness of the sediment body, the size of the body, the shape of the body, and the grain size distribution at each point within the body.
    Type: Grant
    Filed: March 18, 2004
    Date of Patent: October 7, 2008
    Assignee: ExxonMobil Upstream Research Company
    Inventors: Max Deffenbaugh, David C. Hoyal, Neal L. Adair, Chun Huh