Patents by Inventor David C. Neckels

David C. Neckels has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8754390
    Abstract: A method is provided for generating measurement parameters for a particle sample in a particle analyzer. The method includes, interrogating the particle sample with a triggering interrogator and one or more secondary interrogators respectively positioned along a length of an interrogation area, generating respective pulses based upon the interrogation of a first particle from the particle sample, determining a primary pulse detection window based upon a triggering pulse, determining a search interval to find a secondary pulse based upon factors including the primary pulse detection window and a laser delay, adjusting the search interval for laser delay variation dynamically based on the interrogation of the first particle, identifying the secondary pulse in the adjusted search interval, and processing the secondary pulse to determine a peak value of the secondary pulse. Corresponding apparatus are also provided.
    Type: Grant
    Filed: March 10, 2011
    Date of Patent: June 17, 2014
    Assignee: Beckman Coulter, Inc.
    Inventors: Christopher D. Lofstrom, Daniel N. Fox, Thomas L. Thrasher, David C. Neckels
  • Publication number: 20110303859
    Abstract: A method is provided for generating measurement parameters for a particle sample in a particle analyzer. The method includes, interrogating the particle sample with a triggering interrogator and one or more secondary interrogators respectively positioned along a length of an interrogation area, generating respective pulses based upon the interrogation of a first particle from the particle sample, determining a primary pulse detection window based upon a triggering pulse, determining a search interval to find a secondary pulse based upon factors including the primary pulse detection window and a laser delay, adjusting the search interval for laser delay variation dynamically based on the interrogation of the first particle, identifying the secondary pulse in the adjusted search interval, and processing the secondary pulse to determine a peak value of the secondary pulse. Corresponding apparatus are also provided.
    Type: Application
    Filed: March 10, 2011
    Publication date: December 15, 2011
    Inventors: Christopher D. Lofstrom, Daniel N. Fox, Thomas L. Thrasher, David C. Neckels
  • Publication number: 20110221892
    Abstract: A method of calculating a drop delay in a stream of a flow cytometer. In one embodiment the method includes the steps of determining a widths plot by measuring the width of a stream based on an image of the stream and setting drop delay based on the widths plot. In another aspect the invention relates to a flow cytometer system for automatically calculating drop delay. In one embodiment the flow cytometer system includes means for determining a widths plot based on an image of the stream; and means for calculating drop delay based on the widths plot.
    Type: Application
    Filed: March 9, 2011
    Publication date: September 15, 2011
    Inventors: David C. Neckels, Kevin C. Courter