Patents by Inventor David C. Sowell

David C. Sowell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Wafer inspection system
    Patent number: 7308367
    Abstract: A method and system for identifying a defect or contamination on a surface of a material. The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing that data to identify a pattern characteristic of the defect or contamination.
    Type: Grant
    Filed: February 3, 2004
    Date of Patent: December 11, 2007
    Assignee: Qcept Technologies, Inc.
    Inventors: M. Brandon Steele, Jeffrey Alan Hawthorne, Chunho Kim, David C. Sowell
  • Inspection system and apparatus
    Patent number: 7103482
    Abstract: A method and system for identifying a defect or contamination on a surface of a material. The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing that data to identify a pattern characteristic of the defect or contamination.
    Type: Grant
    Filed: August 5, 2004
    Date of Patent: September 5, 2006
    Assignee: Qcept Technologies, Inc.
    Inventors: M. Brandon Steele, Jeffrey Alan Hawthorne, Chunho Kim, David C. Sowell
  • Wafer inspection system
    Publication number: 20040241890
    Abstract: A method and system for identifying a defect or contamination on a surface of a material. The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing that data to identify a pattern characteristic of the defect or contamination.
    Type: Application
    Filed: February 3, 2004
    Publication date: December 2, 2004
    Applicant: QCEPT TECHNOLOGIES, INC.
    Inventors: M. Brandon Steele, Jeffrey Alan Hawthorne, Chunho Kim, David C. Sowell
  • Method for routing calls based on predetermined assignments of callers geographic locations
    Patent number: 5533107
    Abstract: The present invention is a method that enables a business with multiple locations within a LATA to use a single number for its service. All callers dial the same number to reach the subscriber's business, and a network routes the calls to the most appropriate subscriber location based on the geographic location of the caller, time of day, day of week, and/or percent distribution among subscriber locations. The geographic location of the caller is determined using the calling party number (NPA-NXX-XXXX) and either mapping this number to a wire center (using the NPA-NXX) or to a block group (using the entire NPA-NXX-XXXX). An advantage of Area Number Calling is the granularity of block group routing. Block groups are defined by the Census Bureau and typically encompass a much smaller geographic area than a wire center. Block groups are defined by the Census Bureau for the entire United States. Block groups tend to encompass four to twelve blocks, and they honor natural boundaries, like rivers.
    Type: Grant
    Filed: March 1, 1994
    Date of Patent: July 2, 1996
    Assignee: BellSouth Corporation
    Inventors: Janine M. Irwin, James M. Seymour, Iris Y. Chen, James M. Davis, David C. Sowell, Nailesh B. Desai, Julia B. Torbert