Patents by Inventor David Carter Wideman

David Carter Wideman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Associated dual interferometric measurement apparatus for determining a physical property of an object
    Patent number: 5659392
    Abstract: The present invention relates to an apparatus and method for measuring physical properties of an object, such as thickness, group index of refraction, and distance to a surface. The apparatus includes a non-coherent light interferometer (53) and a coherent light interferometer (55) in association so as to share a variable optical path delay element (54). Thickness measurements can be made, for example, of solids, liquids, liquids moving along a horizontal plane, or liquids flowing down a plane. Thickness measurements of multiple layers can be made.
    Type: Grant
    Filed: March 22, 1995
    Date of Patent: August 19, 1997
    Assignee: Eastman Kodak Company
    Inventors: Michael Alan Marcus, Stanley Gross, David Carter Wideman