Patents by Inventor David D. FARRELL

David D. FARRELL has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test and measurement instrument and method of switching waveform display styles
    Patent number: 9529017
    Abstract: A test and measurement instrument and method of switching waveform display styles includes acquiring an electrical signal, storing peak detect data samples from the electrical signal to one or more memory devices, storing filtered data samples or unfiltered data from the electrical signal, automatically switching to a first waveform display style having the peak detect data samples configured in a first mode when a user selects the unfiltered data, and automatically switching to a second waveform display style having the peak detect data samples configured in a second mode when the user selects the filtered data samples.
    Type: Grant
    Filed: February 12, 2014
    Date of Patent: December 27, 2016
    Assignee: Tektronix, Inc.
    Inventors: Gregory A. Martin, David D. Farrell, Evan A. Dickinson
  • Test and measurement instrument and method of switching waveform display styles
    Patent number: 8818744
    Abstract: A test and measurement instrument and method of switching waveform display styles includes acquiring an electrical signal, storing peak detect data samples from the electrical signal to one or more memory devices, storing filtered data samples or unfiltered data from the electrical signal, automatically switching to a first waveform display style having the peak detect data samples configured in a first mode when a user selects the unfiltered data, and automatically switching to a second waveform display style having the peak detect data samples configured in a second mode when the user selects the filtered data samples.
    Type: Grant
    Filed: June 25, 2009
    Date of Patent: August 26, 2014
    Assignee: Tektronix, Inc.
    Inventors: Gregory A. Martin, David D. Farrell, Evan A. Dickinson
  • TEST AND MEASUREMENT INSTRUMENT AND METHOD OF SWITCHING WAVEFORM DISPLAY STYLES
    Publication number: 20140160144
    Abstract: A test and measurement instrument and method of switching waveform display styles includes acquiring an electrical signal, storing peak detect data samples from the electrical signal to one or more memory devices, storing filtered data samples or unfiltered data from the electrical signal, automatically switching to a first waveform display style having the peak detect data samples configured in a first mode when a user selects the unfiltered data, and automatically switching to a second waveform display style having the peak detect data samples configured in a second mode when the user selects the filtered data samples.
    Type: Application
    Filed: February 12, 2014
    Publication date: June 12, 2014
    Applicant: TEKTRONIX, INC.
    Inventors: Gregory A. Martin, David D. Farrell, Evan A. Dickinson
  • Test and Measurement Instrument and Method of Switching Waveform Display Styles
    Publication number: 20100100346
    Abstract: A test and measurement instrument and method of switching waveform display styles includes acquiring an electrical signal, storing peak detect data samples from the electrical signal to one or more memory devices, storing filtered data samples or unfiltered data from the electrical signal, automatically switching to a first waveform display style having the peak detect data samples configured in a first mode when a user selects the unfiltered data, and automatically switching to a second waveform display style having the peak detect data samples configured in a second mode when the user selects the filtered data samples.
    Type: Application
    Filed: June 25, 2009
    Publication date: April 22, 2010
    Applicant: TEKTRONIX, INC.
    Inventors: Gregory A. MARTIN, David D. FARRELL, Evan A. DICKINSON