Abstract: A model of a device is generated. An input port of the device is stimulated with a large amplitude signal having a central frequency. A first port of the device is perturbed with a small amplitude signal tone. The small amplitude signal tone is at a frequency offset slightly from a harmonic of the central frequency. Spectral component frequencies of a resulting signal from the device are obtained to determine model coefficients for the device. At least some of the spectral component frequencies occur at frequencies offset slightly from harmonics of the central frequency.

Abstract: A signal analyzer has an analysis scale and a display scale that are independently selectable. The signal analyzer receives a first representation of an applied signal and provides from the first representation at least two alternative representations. A first selective input enables a designated one of the alternative representations to be applied to a filter to reduce variance of the designated representation. The signal analyzer then converts the received one of the alternative representations having reduced variance to at least two alternative display scales. A second selective input enables a designated one of the alternative display scales to be displayed on a monitor, display screen or other output device of the measurement instrument or system.

Abstract: A vector network analyzer for performing swept frequency measurements on non-linear RF devices, using either an internal or external signal source. This simplifies and speeds linear and non-linear amplifier and mixer measurements, such as impedance, amplifier gain, and mixer conversion loss, on the one hand, and measurement of harmonics, on the other hand.

Abstract: A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automation are provided. Contributions include fully coordinated communications between subsystem modules; real time, two channel, precision vector measurements with complete, internal error correction; wide frequency capability from RF to millimeter bands; combined time and frequency domain analysis and display; measurements either in the swept or step frequency modes; and user definable test functions and calibration device sets.

Abstract: A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automation are provided. Contributions include fully coordinated communications between subsystem modules; real time, two channel, precision vector measurements with complete, internal error correction; wide frequency capability from RF to millimeter bands; combined time and frequency domain analysis and display; measurements either in the swept or step frequency modes; and user definable test functions and calibration device sets.

Abstract: A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automation are provided. Contributions include fully coordinated communications between subsystem modules; real time, two channel, precision vector measurements with complete, internal error correction; wide frequency capability from RF to millimeter bands; combined time and frequency domain analysis and display; measurements either in the swept or step frequency modes; and user definable test functions and calibration device sets.

Abstract: A diamond marker generator circuit generates a diamond-shaped marker making a spot or point on a curve of an input signal being measured.Despite changes in the display or sweep rate of the input signal, the marker's size is kept constant, and its intensity or contrast is maintained at a constant level relative to the intensity of the curve.One marker is generated above the curve to mark a current point of interest to a user. One or more markers are generated below the curve to mark previous points of interest.

Abstract: A network analyzer which compares a reference signal supplied to a device under test with an output signal from the device under test is used to measure the group delay caused by the device under test. The reference signal is produced by a swept frequency signal generator. During the sweep of the signal generator the difference between the instantaneous frequencies of the reference signal and the output signal from the device under test is determined as is the rate of change of the frequency of the reference signal. The instantaneous frequency difference is divided by the rate of change of the reference frequency to produce an instantaneous indication of the group delay produced by the device under test.