Abstract: Joint pricing and replenishment of freshness inventory or products having different qualities determines the joint pricing and inventory strategies to optimize the retailer's benefits from product freshness, employing a dynamic programming formulation that incorporates a demand model that captures consumer choice based on both the freshness and price.

Abstract: Joint pricing and replenishment of freshness inventory or products having different qualities determines the joint pricing and inventory strategies to optimize the retailer's benefits from product freshness, employing a dynamic programming formulation that incorporates a demand model that captures consumer choice based on both the freshness and price.

Abstract: Freshness inventory control problem may be formulated as a stochastic dynamic program. In one aspect, a stochastic dynamic programming formulation takes as input inventory status, stochastic demand forecast and cost information associated with on-hand inventory. The stochastic dynamic programming formulation is maximized to determine order quantity and depletion quantity of the product per period.

Abstract: Freshness inventory control problem may be formulated as a stochastic dynamic program. In one aspect, a stochastic dynamic programming formulation takes as input inventory status, stochastic demand forecast and cost information associated with on-hand inventory. The stochastic dynamic programming formulation is maximized to determine order quantity and depletion quantity of the product per period.

Abstract: Freshness inventory control problem may be formulated as a stochastic dynamic program. In one aspect, a stochastic dynamic programming formulation takes as input inventory status, stochastic demand forecast and cost information associated with on-hand inventory. The stochastic dynamic programming formulation is maximized to determine order quantity and depletion quantity of the product per period.

Abstract: A batch of units of a product are inspected before they are supplied to customers with warranties. The units are either defective or non-defective, realizing a defect index which is a random variable characterized by a statistical distribution. During the inspection, the units identified as being defective are repaired. A dynamic inspection technique has been developed and can be used to identify different thresholds for which number of units within a batch need to be inspected, such that costs due to the inspection, repair and warranty are minimized.

Abstract: An apparatus and method for configuring semiconductor jobs to achieve a desired level of set serviceability, in either probability or expectation, using a minimal number of wafers. The configuration problem is formulated as a mathematical optimization, where the serviceability level and yield losses, at chip, wafer and job levels, are explicitly considered. The problem is then reformulated by replacing the mathematically intractable service level constraints with tractable lower bounds. The reformulated mathematical optimization is efficiently solved using marginal allocation, giving good, feasible solutions to the original configuration program.