Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.

Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.

Abstract: Systems, methods, apparatuses, and computer program products for nonintrusive scanning of objects using X-ray electromagnetic radiation. One method can include generating at least one two-dimensional X-ray radiograph image; generating synthetic flat field data using the at least one two-dimensional X-ray radiograph image, a second two-dimensional X-ray radiograph image, or both; and applying flat field image correction using the synthetic flat field data to the at least one two-dimensional X-ray radiograph image.

Abstract: Systems, methods, apparatuses, and computer program products for nonintrusive scanning of objects using x-ray electromagnetic radiation. One method may include adjusting, by a computed tomography scanning device, at least one operation parameter including a grey value threshold based upon a material composition of a scan target; and collecting, by the computed tomography scanning device, at least one x-ray frame of the scan target based upon the at least one adjusted operation parameter.

Abstract: Disclosed is an optical fiber ferrule apparatus and a method for manufacturing the ferrule apparatus. More particularly, this invention pertains to a ferrule preparation apparatus and method in which the optical fiber is severed through the application of a combination of energy and forced physical separation.

Abstract: Disclosed is an optical fiber ferrule apparatus and a method for manufacturing the ferrule apparatus. More particularly, this invention pertains to a ferrule preparation apparatus and method in which the optical fiber is severed through the application of a combination of energy and forced physical separation.