Patents by Inventor David Daniel Awschalom

David Daniel Awschalom has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electrometry by optical charge conversion of defects in the solid-state
    Patent number: 12174225
    Abstract: Methods and systems are disclosed for sensing an environment electric field. In one exemplary implementation, a method includes disposing a sensor in the environment, wherein the sensor comprising a crystalline lattice and at least one optically-active defect in the crystalline lattice; pre-exciting the crystalline lattice to prepare at least one defect in a first charge state using a first optical beam at a first optical wavelength; converting at least one defect from the first charge state to a second charge state using a second optical beam at a second optical wavelength; monitoring a characteristics of photoluminescence emitted from the defect during or after the conversion of the at least one defect from the first charge state to the second charge state; and determining a characteristics of the electric field in the environment according to the monitored characteristics of the photoluminescence.
    Type: Grant
    Filed: January 24, 2023
    Date of Patent: December 24, 2024
    Assignee: The University of Chicago
    Inventors: Gary Wolfowicz, Samuel James Whiteley, David Daniel Awschalom
  • Electrometry by Optical Charge Conversion of Defects in the Solid-State
    Publication number: 20230349957
    Abstract: Methods and systems are disclosed for sensing an environment electric field. In one exemplary implementation, a method includes disposing a sensor in the environment, wherein the sensor comprising a crystalline lattice and at least one optically-active defect in the crystalline lattice; pre-exciting the crystalline lattice to prepare at least one defect in a first charge state using a first optical beam at a first optical wavelength; converting at least one defect from the first charge state to a second charge state using a second optical beam at a second optical wavelength; monitoring a characteristics of photoluminescence emitted from the defect during or after the conversion of the at least one defect from the first charge state to the second charge state; and determining a characteristics of the electric field in the environment according to the monitored characteristics of the photoluminescence.
    Type: Application
    Filed: January 24, 2023
    Publication date: November 2, 2023
    Applicant: The University of Chicago
    Inventors: Gary Wolfowicz, Samuel James Whiteley, David Daniel Awschalom
  • Electrometry by optical charge conversion of defects in the solid-state
    Patent number: 11619660
    Abstract: Methods and systems are disclosed for sensing an environment electric field. In one exemplary implementation, a method includes disposing a sensor in the environment, wherein the sensor comprising a crystalline lattice and at least one optically-active defect in the crystalline lattice; pre-exciting the crystalline lattice to prepare at least one defect in a first charge state using a first optical beam at a first optical wavelength; converting at least one defect from the first charge state to a second charge state using a second optical beam at a second optical wavelength; monitoring a characteristics of photoluminescence emitted from the defect during or after the conversion of the at least one defect from the first charge state to the second charge state; and determining a characteristics of the electric field in the environment according to the monitored characteristics of the photoluminescence.
    Type: Grant
    Filed: February 13, 2019
    Date of Patent: April 4, 2023
    Assignee: The University of Chicago
    Inventors: Gary Wolfowicz, Samuel James Whiteley, David Daniel Awschalom
  • Electrometry by Optical Charge Conversion of Defects in the Solid-State
    Publication number: 20200400723
    Abstract: Methods and systems are disclosed for sensing an environment electric field. In one exemplary implementation, a method includes disposing a sensor in the environment, wherein the sensor comprising a crystalline lattice and at least one optically-active defect in the crystalline lattice; pre-exciting the crystalline lattice to prepare at least one defect in a first charge state using a first optical beam at a first optical wavelength; converting at least one defect from the first charge state to a second charge state using a second optical beam at a second optical wavelength; monitoring a characteristics of photoluminescence emitted from the defect during or after the conversion of the at least one defect from the first charge state to the second charge state; and determining a characteristics of the electric field in the environment according to the monitored characteristics of the photoluminescence.
    Type: Application
    Filed: February 13, 2019
    Publication date: December 24, 2020
    Applicant: The University of Chicago
    Inventors: Gary Wolfowicz, Samuel James Whiteley, David Daniel Awschalom