Abstract: A light emitting device includes a mounting substrate having a reflective layer that defines spaced apart anode and cathode pads, and a gap between them. A light emitting diode die is flip-chip mounted on the mounting substrate, such that the anode contact of the LED die is bonded to the anode pad and the cathode contact of the LED die is bonded to the cathode pad. A lens extends from the mounting substrate to surround the LED die. The reflective layer extends on the mounting substrate to cover substantially all of the mounting substrate that lies beneath the lens, excluding the gap, and may also extend beyond the lens.

Abstract: A light emitting device includes a mounting substrate having a reflective layer that defines spaced apart anode and cathode pads, and a gap between them. A light emitting diode die is flip-chip mounted on the mounting substrate, such that the anode contact of the LED die is bonded to the anode pad and the cathode contact of the LED die is bonded to the cathode pad. A lens extends from the mounting substrate to surround the LED die. The reflective layer extends on the mounting substrate to cover substantially all of the mounting substrate that lies beneath the lens, excluding the gap, and may also extend beyond the lens.

Abstract: A method for in-set evaluation of critical characteristics and parameters of components utilized in various devices. A component in a device to be evaluated is installed in the actual complex device using a socket for easy placement and removal of multiple components. Additional modifications are made to the device to permit logical evaluation of the critical component parameters of the component in the device. In an exemplary embodiment, evaluation of duplexers utilized in cordless and cellular telephones requires the placement of a desense switch to permit taking measurements in isolation and measurements affected by transmitter interference.